TY - GEN
T1 - Terahertz spectroscopic observation of cross-linked polyethylene aged simultaneously by heat and gamma-rays
AU - Komatsu, Marina
AU - Ohki, Yoshimichi
AU - Mizuno, Maya
AU - Fukunaga, Kaori
PY - 2012/11/26
Y1 - 2012/11/26
N2 - Chemically cross-linked polyethylene irradiated by γ-rays to certain designated doses from 100 to 800 kGy at 100°C in air was analyzed by X-ray diffraction, infrared spectroscopy and terahertz spectroscopy. It was found by infrared spectroscopy that the degree of oxidation increased when the sample was irradiated. By the terahertz spectroscopy, a peak appears at around 44 cm -1 (≃1.3 THz) when the sample was irradiated by γ-rays. By carrying out the Cole-Cole analysis on the complex permittivity spectra associated with the peak at 44 cm-1, the dipolar relaxation was found to exhibit a nearly single relaxation process. This suggests that the terahertz spectroscopy has a potential to detect the oxidative degradation of cross-linked polyethylene.
AB - Chemically cross-linked polyethylene irradiated by γ-rays to certain designated doses from 100 to 800 kGy at 100°C in air was analyzed by X-ray diffraction, infrared spectroscopy and terahertz spectroscopy. It was found by infrared spectroscopy that the degree of oxidation increased when the sample was irradiated. By the terahertz spectroscopy, a peak appears at around 44 cm -1 (≃1.3 THz) when the sample was irradiated by γ-rays. By carrying out the Cole-Cole analysis on the complex permittivity spectra associated with the peak at 44 cm-1, the dipolar relaxation was found to exhibit a nearly single relaxation process. This suggests that the terahertz spectroscopy has a potential to detect the oxidative degradation of cross-linked polyethylene.
KW - Terahertz light
KW - cable insulation
KW - cross-linked polyethylene
KW - radiation-induced degradation
UR - http://www.scopus.com/inward/record.url?scp=84869442135&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84869442135&partnerID=8YFLogxK
U2 - 10.1109/ICPADM.2012.6318955
DO - 10.1109/ICPADM.2012.6318955
M3 - Conference contribution
AN - SCOPUS:84869442135
SN - 9781467328500
T3 - Proceedings of the IEEE International Conference on Properties and Applications of Dielectric Materials
BT - ICPADM 2012 - 2012 IEEE 10th International Conference on the Properties and Applications of Dielectric Materials, Technical Papers
T2 - 2012 IEEE 10th International Conference on the Properties and Applications of Dielectric Materials, ICPADM 2012
Y2 - 24 July 2012 through 28 July 2012
ER -