The platinum/titanium-nitride interface: X-ray photoelectron spectroscopy studies

Nikola Mati*, Gary S. Chottiner, Frank Ernst, Daniel Alberto Scherson

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review


The nature of the interactions between Pt and TiN, a material of interest as a support for proton-exchange-membrane (PEM) fuel cell applications, have been examined in ultrahigh vacuum (UHV) using X-ray photoelectron spectroscopy (XPS). For small amounts of Pt, a reaction takes place yielding XPS features consistent with formation of the intermetallic compound PtTi. Increasing the amount of Pt shifts the 4f 72 electron binding energy toward that of metallic Pt. Complementary angle-resolved XPS revealed that Pt remains in the outer surface region of the resulting multicomponent film. The results show that TiN layers with a thickness of only ca. 1 nm already form an effective barrier to Pt diffusion at room temperature.

Original languageEnglish
JournalElectrochemical and Solid-State Letters
Issue number6
Publication statusPublished - 2012 May 7
Externally publishedYes

ASJC Scopus subject areas

  • Electrochemistry
  • Electrical and Electronic Engineering
  • General Materials Science
  • General Chemical Engineering
  • Physical and Theoretical Chemistry


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