The platinum/titanium-nitride interface: X-ray photoelectron spectroscopy studies

Nikola Mati*, Gary S. Chottiner, Frank Ernst, Daniel Alberto Scherson

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

X-ray photoelectron spectroscopy (XPS) has been used to examine the nature of the interactions between Pt and Ti nitride formed in situ by Ti deposition in a nitrogen atmosphere on Si (111) surfaces in ultrahigh vacuum (UHV). The 4f 7/2 electron binding energy of the initially deposited Pt corresponded to that of the intermetallic compound PtTi. Increasing the amount of deposited Pt shifted the binding energy toward that of metallic Pt. Complementary angleresolved XPS revealed that Pt remains on the outer surface region of the resulting multicomponent film. The results show that TiN layers with a thickness of only ca. 1 nm already form an effective barrier to Pt diffusion at room temperature.

Original languageEnglish
Title of host publicationPolymer Electrolyte Fuel Cells 11
Pages865-874
Number of pages10
Edition1
DOIs
Publication statusPublished - 2011 Dec 1
Externally publishedYes
Event11th Polymer Electrolyte Fuel Cell Symposium, PEFC 11 - 220th ECS Meeting - Boston, MA, United States
Duration: 2011 Oct 92011 Oct 14

Publication series

NameECS Transactions
Number1
Volume41
ISSN (Print)1938-5862
ISSN (Electronic)1938-6737

Conference

Conference11th Polymer Electrolyte Fuel Cell Symposium, PEFC 11 - 220th ECS Meeting
Country/TerritoryUnited States
CityBoston, MA
Period11/10/911/10/14

ASJC Scopus subject areas

  • Engineering(all)

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