TY - JOUR
T1 - Thermal conductivity of SrVO3-SrTiO3 thin films
T2 - Evidence of intrinsic thermal resistance at the interface between oxide layers
AU - Katsufuji, T.
AU - Saiki, T.
AU - Okubo, S.
AU - Katayama, Y.
AU - Ueno, K.
N1 - Funding Information:
This work was supported by JST CREST Grant No. JPMJCR15Q2 and by JSPS KAKENHI Grant No. 16H04020.
Publisher Copyright:
© 2018 American Physical Society.
PY - 2018/5/8
Y1 - 2018/5/8
N2 - By using a technique of thermoreflectance that can precisely measure the thermal conductivity of thin films, we found that the thermal conductivity of SrVO3-SrTiO3 multilayer thin films normal to the surface was substantially reduced by decreasing the thickness of each layer. This indicates that a large intrinsic thermal resistance exists at the interface between SrVO3 and SrTiO3 in spite of the similar phononic properties for these two compounds.
AB - By using a technique of thermoreflectance that can precisely measure the thermal conductivity of thin films, we found that the thermal conductivity of SrVO3-SrTiO3 multilayer thin films normal to the surface was substantially reduced by decreasing the thickness of each layer. This indicates that a large intrinsic thermal resistance exists at the interface between SrVO3 and SrTiO3 in spite of the similar phononic properties for these two compounds.
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U2 - 10.1103/PhysRevMaterials.2.051002
DO - 10.1103/PhysRevMaterials.2.051002
M3 - Article
AN - SCOPUS:85058041727
SN - 2475-9953
VL - 2
JO - Physical Review Materials
JF - Physical Review Materials
IS - 5
M1 - 051002
ER -