Transition Detector-Based Radiation-Hardened Latch for Both Single- And Multiple-Node Upsets

Saki Tajima*, Masao Yanagisawa, Youhua Shi

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

7 Citations (Scopus)


This brief presents an output transition detector-based radiation-hardened latch (TDRHL) for reliability improvement. With an error recovery assistant logic and an in-situ transition detector, for any radiation induced single- and double-node upsets, the proposed TDRHL can 1) provide full self-recovery capability and 2) generate a warning signal for architecture-level recovery when soft errors cause the latch output flipped. The evaluation results show that TDRHL outperforms state-of-the-art double-node upset tolerant designs with addition error detection capability, and up to 5.0X power-delay-product improvement can be achieved.

Original languageEnglish
Article number8755273
Pages (from-to)1114-1118
Number of pages5
JournalIEEE Transactions on Circuits and Systems II: Express Briefs
Issue number6
Publication statusPublished - 2020 Jun


  • Radiation-hardened latch
  • low power
  • multiple node upsets
  • soft error
  • transition detector

ASJC Scopus subject areas

  • Electrical and Electronic Engineering


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