Transition Detector-Based Radiation-Hardened Latch for Both Single- And Multiple-Node Upsets

Saki Tajima; Masao Yanagisawa; Youhua Shi

doi:10.1109/TCSII.2019.2926498

Transition Detector-Based Radiation-Hardened Latch for Both Single- And Multiple-Node Upsets

Saki Tajima^*, Masao Yanagisawa, Youhua Shi

^*Corresponding author for this work

School of Fundamental Science and Engineering

Research output: Contribution to journal › Article › peer-review

7 Citations (Scopus)

Abstract

This brief presents an output transition detector-based radiation-hardened latch (TDRHL) for reliability improvement. With an error recovery assistant logic and an in-situ transition detector, for any radiation induced single- and double-node upsets, the proposed TDRHL can 1) provide full self-recovery capability and 2) generate a warning signal for architecture-level recovery when soft errors cause the latch output flipped. The evaluation results show that TDRHL outperforms state-of-the-art double-node upset tolerant designs with addition error detection capability, and up to 5.0X power-delay-product improvement can be achieved.

Original language	English
Article number	8755273
Pages (from-to)	1114-1118
Number of pages	5
Journal	IEEE Transactions on Circuits and Systems II: Express Briefs
Volume	67
Issue number	6
DOIs	https://doi.org/10.1109/TCSII.2019.2926498
Publication status	Published - 2020 Jun

Keywords

Radiation-hardened latch
low power
multiple node upsets
soft error
transition detector

ASJC Scopus subject areas

Electrical and Electronic Engineering

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10.1109/TCSII.2019.2926498

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title = "Transition Detector-Based Radiation-Hardened Latch for Both Single- And Multiple-Node Upsets",

abstract = "This brief presents an output transition detector-based radiation-hardened latch (TDRHL) for reliability improvement. With an error recovery assistant logic and an in-situ transition detector, for any radiation induced single- and double-node upsets, the proposed TDRHL can 1) provide full self-recovery capability and 2) generate a warning signal for architecture-level recovery when soft errors cause the latch output flipped. The evaluation results show that TDRHL outperforms state-of-the-art double-node upset tolerant designs with addition error detection capability, and up to 5.0X power-delay-product improvement can be achieved.",

keywords = "Radiation-hardened latch, low power, multiple node upsets, soft error, transition detector",

author = "Saki Tajima and Masao Yanagisawa and Youhua Shi",

note = "Funding Information: Manuscript received May 20, 2019; accepted June 27, 2019. Date of publication July 3, 2019; date of current version June 4, 2020. This work was supported in part by the cooperation of organization between Waseda University and Toshiba Memory Corporation. This brief was recommended by Associate Editor M. Chrzanowska-Jeske. (Corresponding author: Saki Tajima.) The authors are with the Department of Electronic and Physical Systems, Faculty of Fundamental Science and Engineering, Waseda University, Tokyo 1698555, Japan (e-mail: saki.tajima@islab.cs.waseda.ac.jp; youhua.shi@islab.cs.waseda.ac.jp). Publisher Copyright: {\textcopyright} 2004-2012 IEEE.",

year = "2020",

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doi = "10.1109/TCSII.2019.2926498",

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AU - Tajima, Saki

AU - Yanagisawa, Masao

AU - Shi, Youhua

N1 - Funding Information: Manuscript received May 20, 2019; accepted June 27, 2019. Date of publication July 3, 2019; date of current version June 4, 2020. This work was supported in part by the cooperation of organization between Waseda University and Toshiba Memory Corporation. This brief was recommended by Associate Editor M. Chrzanowska-Jeske. (Corresponding author: Saki Tajima.) The authors are with the Department of Electronic and Physical Systems, Faculty of Fundamental Science and Engineering, Waseda University, Tokyo 1698555, Japan (e-mail: saki.tajima@islab.cs.waseda.ac.jp; youhua.shi@islab.cs.waseda.ac.jp). Publisher Copyright: © 2004-2012 IEEE.

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N2 - This brief presents an output transition detector-based radiation-hardened latch (TDRHL) for reliability improvement. With an error recovery assistant logic and an in-situ transition detector, for any radiation induced single- and double-node upsets, the proposed TDRHL can 1) provide full self-recovery capability and 2) generate a warning signal for architecture-level recovery when soft errors cause the latch output flipped. The evaluation results show that TDRHL outperforms state-of-the-art double-node upset tolerant designs with addition error detection capability, and up to 5.0X power-delay-product improvement can be achieved.

AB - This brief presents an output transition detector-based radiation-hardened latch (TDRHL) for reliability improvement. With an error recovery assistant logic and an in-situ transition detector, for any radiation induced single- and double-node upsets, the proposed TDRHL can 1) provide full self-recovery capability and 2) generate a warning signal for architecture-level recovery when soft errors cause the latch output flipped. The evaluation results show that TDRHL outperforms state-of-the-art double-node upset tolerant designs with addition error detection capability, and up to 5.0X power-delay-product improvement can be achieved.

KW - Radiation-hardened latch

KW - low power

KW - multiple node upsets

KW - soft error

KW - transition detector

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Transition Detector-Based Radiation-Hardened Latch for Both Single- And Multiple-Node Upsets

Abstract

Keywords

ASJC Scopus subject areas

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