Two beam collection mode photon scanning tunneling microscope

Tetsuya Kawanishi; Kouichiro Tamada; Masao Kitano

doi:10.1007/s10043-997-0601-4

Two beam collection mode photon scanning tunneling microscope

Tetsuya Kawanishi^*, Kouichiro Tamada, Masao Kitano

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

2 Citations (Scopus)

Abstract

We studied the image deformation due to the surface inclination of objects in photon scanning tunneling microscopes (PSTM). A novel collection mode PSTM with two light sources is proposed to reduce the deformation and experimental results show that the PSTM system is effective.

Original language	English
Pages (from-to)	601-604
Number of pages	4
Journal	Optical Review
Volume	4
Issue number	5
DOIs	https://doi.org/10.1007/s10043-997-0601-4
Publication status	Published - 1997 Jan 1
Externally published	Yes

Keywords

Deformation of image
Evanescent wave
Inclination of surface
Near field
Photon scanning tunneling microscope

ASJC Scopus subject areas

Atomic and Molecular Physics, and Optics

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10.1007/s10043-997-0601-4

Cite this

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title = "Two beam collection mode photon scanning tunneling microscope",

abstract = "We studied the image deformation due to the surface inclination of objects in photon scanning tunneling microscopes (PSTM). A novel collection mode PSTM with two light sources is proposed to reduce the deformation and experimental results show that the PSTM system is effective.",

keywords = "Deformation of image, Evanescent wave, Inclination of surface, Near field, Photon scanning tunneling microscope",

author = "Tetsuya Kawanishi and Kouichiro Tamada and Masao Kitano",

year = "1997",

month = jan,

day = "1",

doi = "10.1007/s10043-997-0601-4",

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T1 - Two beam collection mode photon scanning tunneling microscope

AU - Kawanishi, Tetsuya

AU - Tamada, Kouichiro

AU - Kitano, Masao

PY - 1997/1/1

Y1 - 1997/1/1

N2 - We studied the image deformation due to the surface inclination of objects in photon scanning tunneling microscopes (PSTM). A novel collection mode PSTM with two light sources is proposed to reduce the deformation and experimental results show that the PSTM system is effective.

AB - We studied the image deformation due to the surface inclination of objects in photon scanning tunneling microscopes (PSTM). A novel collection mode PSTM with two light sources is proposed to reduce the deformation and experimental results show that the PSTM system is effective.

KW - Deformation of image

KW - Evanescent wave

KW - Inclination of surface

KW - Near field

KW - Photon scanning tunneling microscope

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U2 - 10.1007/s10043-997-0601-4

DO - 10.1007/s10043-997-0601-4

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SN - 1340-6000

VL - 4

SP - 601

EP - 604

JO - Optical Review

JF - Optical Review

IS - 5

ER -

Two beam collection mode photon scanning tunneling microscope

Abstract

Keywords

ASJC Scopus subject areas

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