Two beam collection mode photon scanning tunneling microscope

Tetsuya Kawanishi*, Kouichiro Tamada, Masao Kitano

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)


We studied the image deformation due to the surface inclination of objects in photon scanning tunneling microscopes (PSTM). A novel collection mode PSTM with two light sources is proposed to reduce the deformation and experimental results show that the PSTM system is effective.

Original languageEnglish
Pages (from-to)601-604
Number of pages4
JournalOptical Review
Issue number5
Publication statusPublished - 1997 Jan 1
Externally publishedYes


  • Deformation of image
  • Evanescent wave
  • Inclination of surface
  • Near field
  • Photon scanning tunneling microscope

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics


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