TY - JOUR
T1 - Use of process indices for simplification of the description of vapor deposition systems
AU - Kajikawa, Yuya
AU - Noda, Suguru
AU - Komiyama, Hiroshi
N1 - Funding Information:
We thank Dr. S. B. Kraines for his helpful discussions. One of the authors (YK) was supported by a “Grant-in-Aid for Japan Society for the Promotion of Science (JSPS) Fellows” of the Ministry of Education, Culture, Sports, Science and Technology (MEXT).
PY - 2004/8/25
Y1 - 2004/8/25
N2 - Vapor deposition is a complex process, including gas-phase, surface, and solid-phase phenomena. Because of the complexity of chemical and physical processes occurring in vapor deposition processes, it is difficult to form a comprehensive, fundamental understanding of vapor deposition and to control such systems for obtaining desirable structures and performance. To overcome this difficulty, we present a method for simplifying the complex description of such systems. One simplification method is to separate complex systems into multiple elements, and determine which of these are important elements. We call this method abridgement. The abridgement method retains only the dominant processes in a description of the system, and discards the others. Abridgement can be achieved by using process indices to evaluate the relative importance of the elementary processes. We describe the formulation and use of these process indices through examples of the growth of continuous films, initial deposition processes, and the formation of the preferred orientation of polycrystalline films. In this paper, we propose a method for representing complex vapor deposition processes as a set of simpler processes.
AB - Vapor deposition is a complex process, including gas-phase, surface, and solid-phase phenomena. Because of the complexity of chemical and physical processes occurring in vapor deposition processes, it is difficult to form a comprehensive, fundamental understanding of vapor deposition and to control such systems for obtaining desirable structures and performance. To overcome this difficulty, we present a method for simplifying the complex description of such systems. One simplification method is to separate complex systems into multiple elements, and determine which of these are important elements. We call this method abridgement. The abridgement method retains only the dominant processes in a description of the system, and discards the others. Abridgement can be achieved by using process indices to evaluate the relative importance of the elementary processes. We describe the formulation and use of these process indices through examples of the growth of continuous films, initial deposition processes, and the formation of the preferred orientation of polycrystalline films. In this paper, we propose a method for representing complex vapor deposition processes as a set of simpler processes.
KW - Abridgement
KW - Chemical vapor deposition
KW - Elementary process
KW - Physical vapor deposition
KW - Process index
KW - Systems approach
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U2 - 10.1016/j.mseb.2004.04.013
DO - 10.1016/j.mseb.2004.04.013
M3 - Article
AN - SCOPUS:3242684326
SN - 0921-5107
VL - 111
SP - 156
EP - 163
JO - Materials Science and Engineering B: Solid-State Materials for Advanced Technology
JF - Materials Science and Engineering B: Solid-State Materials for Advanced Technology
IS - 2-3
ER -