Abstract
High feasibility of the vacuum ultraviolet (VUV) and vapor - combined surface modification method was demonstrated at the temperatures lower than 200 °C and atmospheric pressure, for the power/green electronic materials such as SiC (Si-related semiconductors), and GaN. Hybrid bonding of these materials will be of practical use in obtaining high reliability and performance in thin power devices. The water vapor, which was included in VUV irradiation atmosphere (N<inf>2</inf>) at the tuned amount of exposure ((g/m<sup>3</sup>)·s), helped generate hydrogen and hydroxyl radicals, then resulted in the elimination of surface contaminant, partial deoxidization of native oxide, and the formation of hydrate bridging layers at the same time. According to the change in the generation ratio of bridging layers, the exposure of 3 - 4 × 10<sup>3</sup> (g/m<sup>3</sup>)·s was chosen as a possible process window. Upon heating at 150 - 200 °C, the hydrogen bonds, which were followed by the dehydration inside the bridging layers, formed tight adhesion between the surfaces. Although the bond area was limited due to the partial contact at the touchdown, the interface did not contain readily visible voids.
Original language | English |
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Title of host publication | ICEP-IAAC 2015 - 2015 International Conference on Electronic Packaging and iMAPS All Asia Conference |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
Pages | 239-242 |
Number of pages | 4 |
ISBN (Print) | 9784904090138 |
DOIs | |
Publication status | Published - 2015 May 20 |
Event | 2015 International Conference on Electronic Packaging and iMAPS All Asia Conference, ICEP-IAAC 2015 - Kyoto, Japan Duration: 2015 Apr 14 → 2015 Apr 17 |
Other
Other | 2015 International Conference on Electronic Packaging and iMAPS All Asia Conference, ICEP-IAAC 2015 |
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Country/Territory | Japan |
City | Kyoto |
Period | 15/4/14 → 15/4/17 |
Keywords
- atmospheric pressure
- GaN
- hybrid bonding
- low temperature
- SiC
- vacuum ultraviolet (VUV)
ASJC Scopus subject areas
- Electrical and Electronic Engineering