TY - GEN
T1 - X-Ray diffraction properties of silica thin films having single crystalline mesoporous structures
AU - Noma, Takashi
AU - Miyata, Hirokatsu
AU - Takada, Kazuhiro
AU - Iida, Atsuo
PY - 2007
Y1 - 2007
N2 - Detailed X-ray diffraction study of silica films with single crystalline mesoporous structures shows that the behavior of X-rays in these mesoporous materials with nano-scaled structural regularity is quite identical to that in real crystals.
AB - Detailed X-ray diffraction study of silica films with single crystalline mesoporous structures shows that the behavior of X-rays in these mesoporous materials with nano-scaled structural regularity is quite identical to that in real crystals.
UR - http://www.scopus.com/inward/record.url?scp=85086619370&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85086619370&partnerID=8YFLogxK
U2 - 10.1364/oic.2007.fa10
DO - 10.1364/oic.2007.fa10
M3 - Conference contribution
AN - SCOPUS:85086619370
SN - 1557528411
SN - 9781557528414
T3 - Optics InfoBase Conference Papers
BT - Optical Interference Coatings, OIC 2007
PB - Optical Society of America (OSA)
T2 - Optical Interference Coatings, OIC 2007
Y2 - 3 June 2007 through 3 June 2007
ER -