Etsuo Uchida*, Yoshihide Watanabe, Tadaharu Nakamura, Naoya Imai

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review


Calibration curves for the analysis of 12 trace elements Zr, Sr, Rb, Th, Pb, Zn, Cu, Ni, Co, Mn, Cr and Cl in silicate rocks were obtained using the X-ray fluorescence spectrometer, JEOL JSX-60PX with eight standard rocks JB-la, JB-2, JB-3, JGb-1, JA-1, JA-2, JG-1a, JR-1 and JR-2 provided by Geological Survey of Japan. A pressed powder method was employed for the measurement. Background, matrix and standardization corrections were carried out for the measured intensities of characteristic X-rays. The errors of analysis for JB-1a are within 5% for Sr, Ni, Mn and Cr, 5 to 10% for Zr, Zn and Rb, and more than 10% for Th, Pb, Cu, Cl and Co.

Original languageEnglish
Pages (from-to)45-52
Number of pages8
JournalWaseda Daigaku Rikogaku Kenkyusho Hokoku/Bulletin of Science and Engineering Research Laboratory,
Issue number118
Publication statusPublished - 1987 Dec 1

ASJC Scopus subject areas

  • Engineering(all)


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