Abstract
The local structure of highly ordered mesostructured silica films was investigated by using a synchrotron X-ray microbeam and a CCD X-ray detector. Two-dimensional X-ray diffraction patterns clearly showed the detailed arrangement of the mesostructures, in which the hexagonal mesochannels aligned uniaxially in the mesostructured silica films formed on a silica glass substrate with a rubbing-treated thin polyimide coating. The alignment direction was shown to be perpendicular to the rubbing direction. The grazing incidence condition revealed the structural anisotropy of the mesostructures, while normal incidence X-ray diffraction data indicated the in-plane structural uniformity of the films. Extra spots were observed in the diffraction patterns. This suggested that the X-ray beam reflected at the boundary of the mesostructured silica film and the substrate.
Original language | English |
---|---|
Pages (from-to) | 1021-1025 |
Number of pages | 5 |
Journal | Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment |
Volume | 467-468 |
Issue number | PART II |
DOIs | |
Publication status | Published - 2001 |
Externally published | Yes |
Keywords
- Mesostructured silica films
- X-ray micro diffraction
ASJC Scopus subject areas
- Nuclear and High Energy Physics
- Instrumentation