X-ray nanospectroscopy for attogram-scale two-dimensional nanomaterials using photoelectron emission microscopy

Y. Kotani; T. Taniuchi; M. Osada; T. Sasaki; M. Kotsugi; T. Ohkochi; Y. Watanabe; K. Ono

doi:10.1063/1.3463234

X-ray nanospectroscopy for attogram-scale two-dimensional nanomaterials using photoelectron emission microscopy

Y. Kotani^*, T. Taniuchi, M. Osada, T. Sasaki, M. Kotsugi, T. Ohkochi, Y. Watanabe, K. Ono

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Citation (Scopus)

Abstract

We have demonstrated x-ray nanospectroscopy for two-dimensional nanomaterials with attogram (=10^-18gram) weight samples. The x-ray nanospectroscopic characterization of the nanomaterials was performed using SPELEEM (Spectroscopic Photoemission and Low Energy Electron Microscopy) at BL17SU of the SPring-8 in Japan. For quantitative x-ray absorption spectroscopy analysis with high spatial resolution and high stability during the photon energy scan, we have implemented a sample drift correction and a uniform lighting correction by image analysis. Using these corrections, the x-ray absorption spectra from 80nm×80nm. area are significantly improved and the layer-dependent electronic structure analysis is also demonstrated.

Original language	English
Title of host publication	AIP Conference Proceedings
Pages	437-440
Number of pages	4
Volume	1234
DOIs	https://doi.org/10.1063/1.3463234
Publication status	Published - 2010
Externally published	Yes
Event	10th International Conference on Synchrotron Radiation Instrumentation, SRI 2009 - Melbourne, VIC, Australia Duration: 2009 Sept 27 → 2009 Oct 2

Other

Other	10th International Conference on Synchrotron Radiation Instrumentation, SRI 2009
Country/Territory	Australia
City	Melbourne, VIC
Period	09/9/27 → 09/10/2

Keywords

PEEM
two-dimensional nanomaterials
x-ray absorption spectroscopy

ASJC Scopus subject areas

Physics and Astronomy(all)

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10.1063/1.3463234

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Kotani, Y, Taniuchi, T, Osada, M, Sasaki, T, Kotsugi, M, Ohkochi, T, Watanabe, Y & Ono, K 2010, X-ray nanospectroscopy for attogram-scale two-dimensional nanomaterials using photoelectron emission microscopy. in AIP Conference Proceedings. vol. 1234, pp. 437-440, 10th International Conference on Synchrotron Radiation Instrumentation, SRI 2009, Melbourne, VIC, Australia, 09/9/27. https://doi.org/10.1063/1.3463234

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title = "X-ray nanospectroscopy for attogram-scale two-dimensional nanomaterials using photoelectron emission microscopy",

abstract = "We have demonstrated x-ray nanospectroscopy for two-dimensional nanomaterials with attogram (=10-18gram) weight samples. The x-ray nanospectroscopic characterization of the nanomaterials was performed using SPELEEM (Spectroscopic Photoemission and Low Energy Electron Microscopy) at BL17SU of the SPring-8 in Japan. For quantitative x-ray absorption spectroscopy analysis with high spatial resolution and high stability during the photon energy scan, we have implemented a sample drift correction and a uniform lighting correction by image analysis. Using these corrections, the x-ray absorption spectra from 80nm×80nm. area are significantly improved and the layer-dependent electronic structure analysis is also demonstrated.",

keywords = "PEEM, two-dimensional nanomaterials, x-ray absorption spectroscopy",

author = "Y. Kotani and T. Taniuchi and M. Osada and T. Sasaki and M. Kotsugi and T. Ohkochi and Y. Watanabe and K. Ono",

year = "2010",

doi = "10.1063/1.3463234",

language = "English",

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volume = "1234",

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T1 - X-ray nanospectroscopy for attogram-scale two-dimensional nanomaterials using photoelectron emission microscopy

AU - Kotani, Y.

AU - Taniuchi, T.

AU - Osada, M.

AU - Sasaki, T.

AU - Kotsugi, M.

AU - Ohkochi, T.

AU - Watanabe, Y.

AU - Ono, K.

PY - 2010

Y1 - 2010

N2 - We have demonstrated x-ray nanospectroscopy for two-dimensional nanomaterials with attogram (=10-18gram) weight samples. The x-ray nanospectroscopic characterization of the nanomaterials was performed using SPELEEM (Spectroscopic Photoemission and Low Energy Electron Microscopy) at BL17SU of the SPring-8 in Japan. For quantitative x-ray absorption spectroscopy analysis with high spatial resolution and high stability during the photon energy scan, we have implemented a sample drift correction and a uniform lighting correction by image analysis. Using these corrections, the x-ray absorption spectra from 80nm×80nm. area are significantly improved and the layer-dependent electronic structure analysis is also demonstrated.

AB - We have demonstrated x-ray nanospectroscopy for two-dimensional nanomaterials with attogram (=10-18gram) weight samples. The x-ray nanospectroscopic characterization of the nanomaterials was performed using SPELEEM (Spectroscopic Photoemission and Low Energy Electron Microscopy) at BL17SU of the SPring-8 in Japan. For quantitative x-ray absorption spectroscopy analysis with high spatial resolution and high stability during the photon energy scan, we have implemented a sample drift correction and a uniform lighting correction by image analysis. Using these corrections, the x-ray absorption spectra from 80nm×80nm. area are significantly improved and the layer-dependent electronic structure analysis is also demonstrated.

KW - PEEM

KW - two-dimensional nanomaterials

KW - x-ray absorption spectroscopy

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M3 - Conference contribution

AN - SCOPUS:77955044891

SN - 9780735407824

VL - 1234

SP - 437

EP - 440

BT - AIP Conference Proceedings

T2 - 10th International Conference on Synchrotron Radiation Instrumentation, SRI 2009

Y2 - 27 September 2009 through 2 October 2009

ER -

X-ray nanospectroscopy for attogram-scale two-dimensional nanomaterials using photoelectron emission microscopy

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