年別の研究成果
年別の研究成果
フィンガープリント
Hirofumi Shinoharaが活動している研究トピックを掘り下げます。このトピックラベルは、この研究者の研究成果に基づきます。これらがまとまってユニークなフィンガープリントを構成します。
- 1 類似のプロファイル
過去5年の共同研究と上位研究分野
国/地域レベルにおける最近の外部共同研究。点をクリックして詳細を開くか、または
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A 100-Bit-Output Modeling Attack-Resistant SPN Strong PUF with Uniform and High-Randomness Response
Liu, K., Tang, Y., Xu, S., Zhang, R. & Shinohara, H., 2023, 2023 IEEE Custom Integrated Circuits Conference, CICC 2023 - Proceedings. Institute of Electrical and Electronics Engineers Inc., (Proceedings of the Custom Integrated Circuits Conference; vol. 2023-April).研究成果: Conference contribution
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Effect of Quadruple Size Transistor on SRAM Physically Unclonable Function Stabilized by Hot Carrier Injection
Xu, S., Liu, K., Tang, Y., Zhang, R. & Shinohara, H., 2023, 2023 35th International Conference on Microelectronic Test Structure, ICMTS 2023. Institute of Electrical and Electronics Engineers Inc., (IEEE International Conference on Microelectronic Test Structures; vol. 2023-March).研究成果: Conference contribution
1 被引用数 (Scopus) -
VSS-Bias-Based Measurement of Random Telegraph Noise in Hybrid SRAM PUF after Hot Carrier Injection Burn-in
Liu, K., Tang, Y., Xu, S. & Shinohara, H., 2023, 2023 35th International Conference on Microelectronic Test Structure, ICMTS 2023. Institute of Electrical and Electronics Engineers Inc., (IEEE International Conference on Microelectronic Test Structures; vol. 2023-March).研究成果: Conference contribution
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A 0.116pJ/bit Latch-Based True Random Number Generator with Static Inverter Selection and Noise Enhancement
Wang, X., Zhang, R., Wang, Y., Liu, K., Wang, X. & Shinohara, H., 2022, 2022 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2022 - Proceedings. Institute of Electrical and Electronics Engineers Inc., (2022 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2022 - Proceedings).研究成果: Conference contribution
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A 0.186-pJ per Bit Latch-Based True Random Number Generator Featuring Mismatch Compensation and Random Noise Enhancement
Zhang, R., Wang, X., Liu, K. & Shinohara, H., 2022 8月 1, In: IEEE Journal of Solid-State Circuits. 57, 8, p. 2498-2508 11 p.研究成果: Article › 査読
9 被引用数 (Scopus)