TY - GEN
T1 - A 100-Bit-Output Modeling Attack-Resistant SPN Strong PUF with Uniform and High-Randomness Response
AU - Liu, Kunyang
AU - Tang, Yichen
AU - Xu, Shufan
AU - Zhang, Ruilin
AU - Shinohara, Hirofumi
N1 - Publisher Copyright:
© 2023 IEEE.
PY - 2023
Y1 - 2023
N2 - Strong physically unclonable function (Strong PUF) [1] is a unified solution for lightweight IoT edge device authentication (Fig. 1). Although recent research made breakthroughs on the conventional issue of modeling attack vulnerability, these studies had to limit the output to 1 bit [2] -[4] or 5 bits [5] using XOR in the final stage. To generate enough response bits for one authentication period, e.g., 100 bits, either 100-time server communications (latency/energy/CRP consumption in communications) or multiple parallel Strong PUF macros (huge area) are required. The reason of limitation is that the pre-XOR response bits have high correlation, and each bit is not random enough when the challenge input changes. In this case, an attacker can simplify the attack model and break the Strong PUF. It is a big challenge to expand the output space securely without increasing entropy sources.
AB - Strong physically unclonable function (Strong PUF) [1] is a unified solution for lightweight IoT edge device authentication (Fig. 1). Although recent research made breakthroughs on the conventional issue of modeling attack vulnerability, these studies had to limit the output to 1 bit [2] -[4] or 5 bits [5] using XOR in the final stage. To generate enough response bits for one authentication period, e.g., 100 bits, either 100-time server communications (latency/energy/CRP consumption in communications) or multiple parallel Strong PUF macros (huge area) are required. The reason of limitation is that the pre-XOR response bits have high correlation, and each bit is not random enough when the challenge input changes. In this case, an attacker can simplify the attack model and break the Strong PUF. It is a big challenge to expand the output space securely without increasing entropy sources.
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U2 - 10.1109/CICC57935.2023.10121278
DO - 10.1109/CICC57935.2023.10121278
M3 - Conference contribution
AN - SCOPUS:85160015400
T3 - Proceedings of the Custom Integrated Circuits Conference
BT - 2023 IEEE Custom Integrated Circuits Conference, CICC 2023 - Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 44th Annual IEEE Custom Integrated Circuits Conference, CICC 2023
Y2 - 23 April 2023 through 26 April 2023
ER -