A 100-Bit-Output Modeling Attack-Resistant SPN Strong PUF with Uniform and High-Randomness Response

Kunyang Liu*, Yichen Tang, Shufan Xu, Ruilin Zhang, Hirofumi Shinohara

*この研究の対応する著者

研究成果: Conference contribution

抄録

Strong physically unclonable function (Strong PUF) [1] is a unified solution for lightweight IoT edge device authentication (Fig. 1). Although recent research made breakthroughs on the conventional issue of modeling attack vulnerability, these studies had to limit the output to 1 bit [2] -[4] or 5 bits [5] using XOR in the final stage. To generate enough response bits for one authentication period, e.g., 100 bits, either 100-time server communications (latency/energy/CRP consumption in communications) or multiple parallel Strong PUF macros (huge area) are required. The reason of limitation is that the pre-XOR response bits have high correlation, and each bit is not random enough when the challenge input changes. In this case, an attacker can simplify the attack model and break the Strong PUF. It is a big challenge to expand the output space securely without increasing entropy sources.

本文言語English
ホスト出版物のタイトル2023 IEEE Custom Integrated Circuits Conference, CICC 2023 - Proceedings
出版社Institute of Electrical and Electronics Engineers Inc.
ISBN(電子版)9798350399486
DOI
出版ステータスPublished - 2023
イベント44th Annual IEEE Custom Integrated Circuits Conference, CICC 2023 - San Antonio, United States
継続期間: 2023 4月 232023 4月 26

出版物シリーズ

名前Proceedings of the Custom Integrated Circuits Conference
2023-April
ISSN(印刷版)0886-5930

Conference

Conference44th Annual IEEE Custom Integrated Circuits Conference, CICC 2023
国/地域United States
CitySan Antonio
Period23/4/2323/4/26

ASJC Scopus subject areas

  • 電子工学および電気工学

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