A high precision positive temperature circuit using DEM technique

Hang Liu, Yu Jin, Xin Hang Li, Duli Yu, Kedu Han, Heming Sun

研究成果: Conference article査読


A novel positive temperature voltage circuit structure with dynamic element matching(DEM) calibration technology is proposed in this paper. The consistency of the thermometer output voltage is an important factor to ameliorate the precision in a thermometer circuit. The introduction of DEM technology reduces the mismatch error of the current source in the positive temperature voltage generating circuit, and improves the output voltage accuracy and voltage consistency. The circuit simulation results show that the positive temperature generating circuit using the DEM calibration circuit can reduce the offset voltage by 83.4% with good linearity property within -55°C to 125°C. The proposed positive temperature voltage circuit with DEM calibration is also considered to reduce power consumption and circuit complexity.

ジャーナルProceedings of International Conference on ASIC
出版ステータスPublished - 2021
イベント14th IEEE International Conference on ASIC, ASICON 2021 - Kunming, China
継続期間: 2021 10月 262021 10月 29

ASJC Scopus subject areas

  • ハードウェアとアーキテクチャ
  • 電子工学および電気工学


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