In this paper, we present a test data compression technique to reduce test data volume for multiscan-based designs. In our method the internal scan chains are divided into equal sized groups and two dictionaries were build to encode either an entire slice or a subset of the slice. Depending on the codeword, the decompressor may load all scan chains or may load only a group of the scan chains, which can enhance the effectiveness of dictionary-based compression. In contrast to previous dictionary coding techniques, even for the CUT with a large number of scan chains, the proposed approach can achieve satisfied reduction in test data volume with a reasonable smaller dictionary. Experimental results showed the proposed test scheme works particularly well for the large ISCAS'89 benchmarks.
|ジャーナル||IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences|
|出版ステータス||Published - 2004 12月|
ASJC Scopus subject areas
- コンピュータ グラフィックスおよびコンピュータ支援設計