TY - GEN
T1 - A method of gender classification by integrating facial, hairstyle, and clothing images
AU - Ueki, Kazuya
AU - Komatsu, Hiromitsu
AU - Imaizumi, Satoshi
AU - Kaneko, Kenichi
AU - Imaizumi, Satoshi
AU - Sekine, Nobuhiro
AU - Katto, Jiro
AU - Kobayashi, Tetsunori
PY - 2004/12/20
Y1 - 2004/12/20
N2 - This paper presents a method of gender classification by integrating facial, hairstyle, and clothing images. Initially, input images are separated into facial, hairstyle and clothing regions, and independently learned PCAs and GMMs based on thousands of sample images are applied to each region. The classification results are then integrated into a single score using some known priors based on the Bayes rule. Experimental results showed that our integration strategy significantly reduced error rate in gender classification compared with the conventional facial only approach.
AB - This paper presents a method of gender classification by integrating facial, hairstyle, and clothing images. Initially, input images are separated into facial, hairstyle and clothing regions, and independently learned PCAs and GMMs based on thousands of sample images are applied to each region. The classification results are then integrated into a single score using some known priors based on the Bayes rule. Experimental results showed that our integration strategy significantly reduced error rate in gender classification compared with the conventional facial only approach.
UR - http://www.scopus.com/inward/record.url?scp=10044221726&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=10044221726&partnerID=8YFLogxK
U2 - 10.1109/ICPR.2004.1333798
DO - 10.1109/ICPR.2004.1333798
M3 - Conference contribution
AN - SCOPUS:10044221726
SN - 0769521282
T3 - Proceedings - International Conference on Pattern Recognition
SP - 446
EP - 449
BT - Proceedings of the 17th International Conference on Pattern Recognition, ICPR 2004
A2 - Kittler, J.
A2 - Petrou, M.
A2 - Nixon, M.
T2 - Proceedings of the 17th International Conference on Pattern Recognition, ICPR 2004
Y2 - 23 August 2004 through 26 August 2004
ER -