A New Ion Counting System Devised for Mass-Selective Detection of Sputtered Neutrals in Laser SNMS

Shingo Ichimura*, Keisuke Goto, Kiyohide Kokubun, Hazime Shimizu, Shigeki Matsuura

*この研究の対応する著者

研究成果: Article査読

3 被引用数 (Scopus)

抄録

A new ion counting system was devised for time-of-flight mass detection in sputtered neutral mass spectrometry (SNMS), using a pulse laser for postionization. A microchannel plate (MCP) intensifier used as a detector was gated by a retarding grid in front of the MCP for particular masses. High peak-counting ability (exceeding 1010 counts per second) of the system for ionization with a laser pulse (20–30 ns) was maintained for mass-selective detection. The performance of the new counting system at a high count rate was analyzed, and the detection limit and the accuracy were discussed.

本文言語English
ページ(範囲)L1209-L1212
ジャーナルJapanese journal of applied physics
29
7
DOI
出版ステータスPublished - 1990 7月
外部発表はい

ASJC Scopus subject areas

  • 工学(全般)
  • 物理学および天文学(全般)

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