A new low power BIST methodology by altering the structure of linear feedback shift registers

Rui Li; Chen Hu; Jun Yang; Zhe Zhang; Youhua Shi; Longxing Shi

A new low power BIST methodology by altering the structure of linear feedback shift registers

Rui Li^*, Chen Hu, Jun Yang, Zhe Zhang, Youhua Shi, Longxing Shi

^*この研究の対応する著者

研究成果: Paper › 査読

1 被引用数 (Scopus)

抄録

In this paper a new low power BIST methodology by altering the structure of linear feedback shift register (LFSR) is proposed. In pseudo-random test mode, the efficiency of the vectors decreases sharply as the test progresses. For low power consumption during test mode, the proposed approach ignores the non-detecting vectors by altering the structure of LFSR. Note that altering the structure of LFSR is efficient, and its has no impact on the fault coverage.

本文言語	English
ページ	646-649
ページ数	4
出版ステータス	Published - 2001
外部発表	はい
イベント	4th International Conference on ASIC Proceedings - Shanghai, China 継続期間: 2001 10月 23 → 2001 10月 25

Conference

Conference	4th International Conference on ASIC Proceedings
国/地域	China
City	Shanghai
Period	01/10/23 → 01/10/25

ASJC Scopus subject areas

工学（全般）

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引用スタイル

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title = "A new low power BIST methodology by altering the structure of linear feedback shift registers",

abstract = "In this paper a new low power BIST methodology by altering the structure of linear feedback shift register (LFSR) is proposed. In pseudo-random test mode, the efficiency of the vectors decreases sharply as the test progresses. For low power consumption during test mode, the proposed approach ignores the non-detecting vectors by altering the structure of LFSR. Note that altering the structure of LFSR is efficient, and its has no impact on the fault coverage.",

author = "Rui Li and Chen Hu and Jun Yang and Zhe Zhang and Youhua Shi and Longxing Shi",

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T1 - A new low power BIST methodology by altering the structure of linear feedback shift registers

AU - Li, Rui

AU - Hu, Chen

AU - Yang, Jun

AU - Zhang, Zhe

AU - Shi, Youhua

AU - Shi, Longxing

PY - 2001

Y1 - 2001

N2 - In this paper a new low power BIST methodology by altering the structure of linear feedback shift register (LFSR) is proposed. In pseudo-random test mode, the efficiency of the vectors decreases sharply as the test progresses. For low power consumption during test mode, the proposed approach ignores the non-detecting vectors by altering the structure of LFSR. Note that altering the structure of LFSR is efficient, and its has no impact on the fault coverage.

AB - In this paper a new low power BIST methodology by altering the structure of linear feedback shift register (LFSR) is proposed. In pseudo-random test mode, the efficiency of the vectors decreases sharply as the test progresses. For low power consumption during test mode, the proposed approach ignores the non-detecting vectors by altering the structure of LFSR. Note that altering the structure of LFSR is efficient, and its has no impact on the fault coverage.

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UR - http://www.scopus.com/inward/citedby.url?scp=0035721073&partnerID=8YFLogxK

M3 - Paper

AN - SCOPUS:0035721073

SP - 646

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T2 - 4th International Conference on ASIC Proceedings

Y2 - 23 October 2001 through 25 October 2001

ER -

A new low power BIST methodology by altering the structure of linear feedback shift registers

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ASJC Scopus subject areas

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