抄録
We have investigated polarized Raman spectra of epitaxial Pb(Zr x Ti 1-x )O 3 (PZT) thin films (x = 0.35) in which the volume ratio of the polar c -domains is systematically varied from 4 to 96% relative to the non-polar a -domains, and a new method using polarized Raman spectroscopy to characterize a relative volume of c -domain in a PZT film is proposed. This method depends on discovery that an intensity of A 1 (1TO) is proportional to the relative volume of c -domain. Polarized Raman spectroscopy is necessary to separate the peaks from A 1 (1TO) and B 1 modes to any other modes.
| 本文言語 | English |
|---|---|
| ホスト出版物のタイトル | Integrated Ferroelectrics |
| ページ | 281-287 |
| ページ数 | 7 |
| 巻 | 78 |
| 版 | 1 |
| DOI | |
| 出版ステータス | Published - 2006 11月 1 |
| 外部発表 | はい |
ASJC Scopus subject areas
- 電子工学および電気工学
- 物理学および天文学（その他）
- 凝縮系物理学
- 電子材料、光学材料、および磁性材料