抄録
In this paper, we presented a Design-for-Secure-Test (DFST) technique for pipelined AES to guarantee both the security and the test quality during testing. Unlike previous works, the proposed method can keep all the secrets inside and provide high test quality and fault diagnosis ability as well. Furthermore, the proposed DFST technique can significantly reduce test application time, test data volume, and test generation effort as additional benefits.
本文言語 | English |
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ページ(範囲) | 776-780 |
ページ数 | 5 |
ジャーナル | IEICE Transactions on Information and Systems |
巻 | E91-D |
号 | 3 |
DOI | |
出版ステータス | Published - 2008 3月 |
ASJC Scopus subject areas
- ソフトウェア
- ハードウェアとアーキテクチャ
- コンピュータ ビジョンおよびパターン認識
- 電子工学および電気工学
- 人工知能