A Segmented Local Offset Method for Imbalanced Data Classification Using Quasi-Linear Support Vector Machine

Peifeng Liang, Xin Yuan, Weite Li, Jinglu Hu

研究成果: Conference contribution

4 被引用数 (Scopus)

抄録

Within-class imbalance problems often occur in imbalance classification which worsen the imbalance distribution problem and increase the learning concept complexity. However, most of existing methods for imbalanced classification focus on rectifying the between-class which are insufficiencies and inappropriateness in many different scenarios. This paper proposes a novel quasi-linear SVM with local offset adjustment method for imbalance classification problem. Our chief aim is to use leaning offsets of sub-clusters obtained according to imbalance ratios of sub-clusters to adjust classifier to achieve the best results. For this purpose, firstly, a geometry-based partitions method for imbalance dataset is introduced to partition the input space into several linearly separable partitions so as to construct a quasi-linear kernel and obtain an SVM classifier. Then a local offset method based on F-score value for linearly separable imbalance dataset is introduced to obtain leaning offset of each partition. At last the quasi-linear SVM with local offset adjustment is used to get the classifier for imbalance datasets. Simulation results on different real different real world datasets show that the proposed method is effective for imbalanced data classifications.

本文言語English
ホスト出版物のタイトル2018 24th International Conference on Pattern Recognition, ICPR 2018
出版社Institute of Electrical and Electronics Engineers Inc.
ページ746-751
ページ数6
ISBN(電子版)9781538637883
DOI
出版ステータスPublished - 2018 11月 26
イベント24th International Conference on Pattern Recognition, ICPR 2018 - Beijing, China
継続期間: 2018 8月 202018 8月 24

出版物シリーズ

名前Proceedings - International Conference on Pattern Recognition
2018-August
ISSN(印刷版)1051-4651

Other

Other24th International Conference on Pattern Recognition, ICPR 2018
国/地域China
CityBeijing
Period18/8/2018/8/24

ASJC Scopus subject areas

  • コンピュータ ビジョンおよびパターン認識

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