抄録
An improved version of the laser speckle strain gauge is presented in which speckle displacement caused by deformation of a laser-illuminated object is detected in real time using new photodetectors in place of the linear image sensors and microcomputer in the conventional version. The detector, called a spatial filtering detector with electronic scanning produces a voltage directly proportional to speckle displacement. Therefore, this strain gage, which utilizes differential speckle displacement, delivers a voltage that is proportional to surface strain. It has a strain sensitivity of a few millivolts per microstrain. We applied this gauge to strain measurements of high-polymer films in various directions under loading at frequencies up to several tens of hertz and were able to evaluate their Poisson ratios.
| 本文言語 | English |
|---|---|
| ページ（範囲） | 671-676 |
| ページ数 | 6 |
| ジャーナル | Optical Engineering |
| 巻 | 25 |
| 号 | 5 |
| 出版ステータス | Published - 1986 5月 |
| 外部発表 | はい |
ASJC Scopus subject areas
- 原子分子物理学および光学