Accelerating covering array generation by combinatorial join for industry scale software testing

Hiroshi Ukai*, Xiao Qu, Hironori Washizaki, Yoshiaki Fukazawa

*この研究の対応する著者

研究成果: Article査読

抄録

Combinatorial interaction testing, which is a technique to verify a system with numerous input parameters, employs a mathematical object called a covering array as a test input. This technique generates a limited number of test cases while guaranteeing a given combinatorial coverage. Although this area has been studied extensively, handling constraints among input parameters remains a major challenge, which may significantly increase the cost to generate covering arrays. In this work, we propose a mathematical operation, called “weaken-product based combinatorial join”, which constructs a new covering array from two existing covering arrays. The operation reuses existing covering arrays to save computational resource by increasing parallelism during generation without losing combinatorial coverage of the original arrays. Our proposed method significantly reduce the covering array generation time by 13–96% depending on use case scenarios.

本文言語English
論文番号e720
ジャーナルPeerJ Computer Science
8
DOI
出版ステータスPublished - 2022

ASJC Scopus subject areas

  • コンピュータサイエンス一般

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