Activation properties of schottky CdTe diodes irradiated by 150 MeV protons

Mio M. Murakami*, Yoshihito Kobayashi, Motohide Kokubun, Isao Takahashi, Yuu Okada, Madoka Kawaharada, Kazuhiro Nakazawa, Shin Watanabe, Goro Sato, Manabu Kouda, Takefumi Mitani, Tadayuki Takahashi, Masaya Suzuki, Makoto Tashiro, Satoshi Kawasoe, Masaharu Nomachi, Kazuo Makishima

*この研究の対応する著者

    研究成果: Article査読

    13 被引用数 (Scopus)

    抄録

    Cadmium Telluride (CdTe), with its high photon absorption efficiency, has been regarded as a promising semiconductor material for the next generation X/γ-ray detectors. In order to apply this device to astrophysics, it is essential to investigate the radiation hardness and background properties induced by cosmic-ray protons in orbit. We irradiated Schottky CdTe diodes and a CdTe block with a beam of mono-energetic (150 MeV) protons. The induced activation in CdTe was measured externally with a germanium detector, and internally with the irradiated CdTe diode itself. We successfully identified most of radioactive isotopes induced mainly via (p, xn) reactions, and confirmed that the activation background level of CdTe diode is sufficiently low in orbit. We compared energy resolution and leakage current before and after the irradiation and also monitored the signals from a calibration source during the irradiation. There have been no significant degradation. CdTe diodes are tolerant enough to radioactivity in low earth orbit.

    本文言語English
    ページ(範囲)1013-1019
    ページ数7
    ジャーナルIEEE Transactions on Nuclear Science
    50
    4 II
    DOI
    出版ステータスPublished - 2003 8月

    ASJC Scopus subject areas

    • 電子工学および電気工学
    • 原子力エネルギーおよび原子力工学

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