抄録
A study was performed on amorphous-to-crystalline transition during the early stages of thin film growth. Transmission electron microscopy was used to study the growth of sputter-deposited chromium thin films on silica. The existence of interfacial Cr-O interactions was confirmed by the depth profile analysis by x-ray photoelectron spectroscopy.
| 本文言語 | English |
|---|---|
| ページ（範囲） | 9336-9344 |
| ページ数 | 9 |
| ジャーナル | Journal of Applied Physics |
| 巻 | 93 |
| 号 | 11 |
| DOI | |
| 出版ステータス | Published - 2003 6月 1 |
| 外部発表 | はい |
ASJC Scopus subject areas
- 物理学および天文学（全般）