An analytical model of the overshooting effect for multiple-input gates in nanometer technologies

Li Ding; Jing Wang; Zhangcai Huang; Atsushi Kurokawa; Yasuaki Inoue

doi:10.1109/ISCAS.2013.6572194

An analytical model of the overshooting effect for multiple-input gates in nanometer technologies

Li Ding, Jing Wang, Zhangcai Huang, Atsushi Kurokawa, Yasuaki Inoue

研究成果: Conference contribution

抄録

The overshooting effect, which is induced by the input-to-output coupling capacitance, has an significant effect on CMOS gate delay with the scaling of CMOS technology. In this paper, an effective analytical model is proposed to calculate the overshooting time of multiple-input gates. The proposed model is verified having a good agreement with SPICE simulation results.

本文言語	English
ホスト出版物のタイトル	Proceedings - IEEE International Symposium on Circuits and Systems
ページ	1712-1715
ページ数	4
DOI	https://doi.org/10.1109/ISCAS.2013.6572194
出版ステータス	Published - 2013
イベント	2013 IEEE International Symposium on Circuits and Systems, ISCAS 2013 - Beijing 継続期間: 2013 5月 19 → 2013 5月 23

Other

Other	2013 IEEE International Symposium on Circuits and Systems, ISCAS 2013
City	Beijing
Period	13/5/19 → 13/5/23

ASJC Scopus subject areas

電子工学および電気工学

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10.1109/ISCAS.2013.6572194

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Ding, L, Wang, J, Huang, Z, Kurokawa, A & Inoue, Y 2013, An analytical model of the overshooting effect for multiple-input gates in nanometer technologies. in Proceedings - IEEE International Symposium on Circuits and Systems., 6572194, pp. 1712-1715, 2013 IEEE International Symposium on Circuits and Systems, ISCAS 2013, Beijing, 13/5/19. https://doi.org/10.1109/ISCAS.2013.6572194

@inproceedings{74706d1c828443aaaeb04790146e4bea,

title = "An analytical model of the overshooting effect for multiple-input gates in nanometer technologies",

abstract = "The overshooting effect, which is induced by the input-to-output coupling capacitance, has an significant effect on CMOS gate delay with the scaling of CMOS technology. In this paper, an effective analytical model is proposed to calculate the overshooting time of multiple-input gates. The proposed model is verified having a good agreement with SPICE simulation results.",

author = "Li Ding and Jing Wang and Zhangcai Huang and Atsushi Kurokawa and Yasuaki Inoue",

year = "2013",

doi = "10.1109/ISCAS.2013.6572194",

language = "English",

isbn = "9781467357609",

pages = "1712--1715",

booktitle = "Proceedings - IEEE International Symposium on Circuits and Systems",

note = "2013 IEEE International Symposium on Circuits and Systems, ISCAS 2013 ; Conference date: 19-05-2013 Through 23-05-2013",

}

TY - GEN

T1 - An analytical model of the overshooting effect for multiple-input gates in nanometer technologies

AU - Ding, Li

AU - Wang, Jing

AU - Huang, Zhangcai

AU - Kurokawa, Atsushi

AU - Inoue, Yasuaki

PY - 2013

Y1 - 2013

N2 - The overshooting effect, which is induced by the input-to-output coupling capacitance, has an significant effect on CMOS gate delay with the scaling of CMOS technology. In this paper, an effective analytical model is proposed to calculate the overshooting time of multiple-input gates. The proposed model is verified having a good agreement with SPICE simulation results.

AB - The overshooting effect, which is induced by the input-to-output coupling capacitance, has an significant effect on CMOS gate delay with the scaling of CMOS technology. In this paper, an effective analytical model is proposed to calculate the overshooting time of multiple-input gates. The proposed model is verified having a good agreement with SPICE simulation results.

UR - http://www.scopus.com/inward/record.url?scp=84883425320&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84883425320&partnerID=8YFLogxK

U2 - 10.1109/ISCAS.2013.6572194

DO - 10.1109/ISCAS.2013.6572194

M3 - Conference contribution

AN - SCOPUS:84883425320

SN - 9781467357609

SP - 1712

EP - 1715

BT - Proceedings - IEEE International Symposium on Circuits and Systems

T2 - 2013 IEEE International Symposium on Circuits and Systems, ISCAS 2013

Y2 - 19 May 2013 through 23 May 2013

ER -

An analytical model of the overshooting effect for multiple-input gates in nanometer technologies

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Other

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