An Embedded SiC Module with Using NMPB Interconnection for Chevron Shaped Cu Lead and Electrodes

Naoki Fukui, Keiko Koshiba, Itaru Miyazaki, Isamu Morisako, Tomonori Iizuka, Tomoya Itose, Masayuki Hikita, Rikiya Kamimura, Kohei Tatsumi

研究成果: Conference contribution

抄録

As for the IGBT power device based on Si used for the vehicle, the performance limit of the Si semiconductor has been pointed out, and the SiC semiconductor has been attracting attention as a next-generation semiconductor. The SiC semiconductor has advantages such as a wider band gap, a larger breakdown electric field, and high temperature operation (about 300 ° C.). If these features can be maximized, a SiC power semiconductor module that can be significantly improved in efficiency, downsized, and operable in a high-temperature environment as compared with a Si semiconductor can be more widely implemented.In this study, two sets of SiC-MOS and SiC-SBD devices are embedded in a ceramic substrate, and their electrodes and the copper electrodes of the substrate are interconnected by NMPB (Nickel Micro-plating Bonding) method, so that one-leg prototype inverter modules of a highly heat-resistant and ultra-small size (47x30x1.3mm) could be manufactured. The NMPB method is a technology that we have originally developed to connect a chip electrode and a lead formed in a chevron shape by Ni plating. High-temperature operation and excellent switching characteristics of the SiC power module were demonstrated.

本文言語English
ホスト出版物のタイトルProceedings - IEEE 70th Electronic Components and Technology Conference, ECTC 2020
出版社Institute of Electrical and Electronics Engineers Inc.
ページ2226-2229
ページ数4
ISBN(電子版)9781728161808
DOI
出版ステータスPublished - 2020 6月
イベント70th IEEE Electronic Components and Technology Conference, ECTC 2020 - Orlando, United States
継続期間: 2020 6月 32020 6月 30

出版物シリーズ

名前Proceedings - Electronic Components and Technology Conference
2020-June
ISSN(印刷版)0569-5503

Conference

Conference70th IEEE Electronic Components and Technology Conference, ECTC 2020
国/地域United States
CityOrlando
Period20/6/320/6/30

ASJC Scopus subject areas

  • 電子材料、光学材料、および磁性材料
  • 電子工学および電気工学

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