An in Situ Study on Electroless-Deposition Process by Scanning Tunneling Microscopy

Takayuki Homma, Takuya Yamazaki, Tetsuya Osaka

研究成果: Article査読

7 被引用数 (Scopus)

抄録

The electroless-deposition process of NiP film was studied using in situ scanning tunneling microscopy (STM). By potentiostatic control of the substrate electrode during the STM scan, the initial deposition process of NiP was observed, revealing features that differ from those of the electrodeposition process, which was also observed in situ. The growth process over the same area during the progress of deposition was also observed sequentially. The results obtained suggest that the electroless-deposition process of NiP is a result of continuous nucleation of grains and their three-dimensional growth.

本文言語English
ページ(範囲)732-736
ページ数5
ジャーナルJournal of the Electrochemical Society
139
3
DOI
出版ステータスPublished - 1992 3月

ASJC Scopus subject areas

  • 電子材料、光学材料、および磁性材料
  • 再生可能エネルギー、持続可能性、環境
  • 表面、皮膜および薄膜
  • 電気化学
  • 材料化学

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