抄録
The authors have developed an ultrahigh-resolution spin-resolved photoemission spectrometer equipped with a highly efficient mini Mott detector and a high-intensity xenon plasma discharge lamp. An electron deflector situated between the hemispherical electron-energy analyzer and the Mott detector enables the determination of the electron's spin-polarization in three independent directions and the spectrometer achieves an energy resolution of 0.9 and 8 meV for nonspin-resolved and spin-resolved modes, respectively. By using this spectrometer, we have performed spin- and angle-resolved photoemission spectroscopy of bismuth thin films on Si(111) to investigate the spin structure of surface states. Unlike conventional Rashba splitting, the magnitude of the in-plane spin polarization is asymmetric across the zone center between the two elongated surface hole pockets and there is a giant out-of-plane spin polarization. The authors discuss these unusual spin textures in terms of a possible time-reversal symmetry breaking.
本文言語 | English |
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論文番号 | 04E107 |
ジャーナル | Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics |
巻 | 30 |
号 | 4 |
DOI | |
出版ステータス | Published - 2012 7月 |
外部発表 | はい |
ASJC Scopus subject areas
- 電子材料、光学材料、および磁性材料
- 器械工学
- プロセス化学およびプロセス工学
- 表面、皮膜および薄膜
- 電子工学および電気工学
- 材料化学