Atomically Controlled Surfaces, Interfaces and Nanostructures/Scanning Probe Microscopy

Takuji Takahashi, Daisuke Fujita, Hirokazu Fukidome, Ken Ichi Fukui, Hiroki Hibino, Masami Kageshima, Tadahiro Komeda, Ken Nakajima, Makoto Nakamura, Tomonobu Nakayama, Hiroshi Nohira, Kaoru Sasakawa, Naruo Sasaki, Koji Sumitomo, Takayuki Uchihashi, Takanobu Watanabe, Yoichi Yamada

研究成果: Editorial査読

本文言語English
論文番号SI0001
ジャーナルJapanese journal of applied physics
58
SI
DOI
出版ステータスPublished - 2019

ASJC Scopus subject areas

  • 工学一般
  • 物理学および天文学一般

引用スタイル