抄録
Substrate surface treatment techniques and growth conditions are the key of growing high-quality cubic GaN (c-GaN) epitaxial layers on (0 0 1) GaAs substrates. An atomically flat (0 0 1) GaAs substrate surface can be obtained by a two-step atomic hydrogen (atomic-H) irradiation technique. The typical surface of the substrate treated by the atomic-H consists of narrow terraces of one monolayer step height with acute-angle polygonal structures. The X-ray rocking curve FWHM of GaN (0 0 2) grown on the atomic-H treated substrate is less than 90 arcsec. It is shown that high-density monolayer steps and kinks at the surface terrace edge would be preferable for the uniform nucleation of the c-GaN buffer layer.
本文言語 | English |
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ページ(範囲) | 265-269 |
ページ数 | 5 |
ジャーナル | Journal of Crystal Growth |
巻 | 189-190 |
DOI | |
出版ステータス | Published - 1998 6月 15 |
外部発表 | はい |
ASJC Scopus subject areas
- 凝縮系物理学
- 無機化学
- 材料化学