TY - GEN
T1 - Automated Tool for Revising Masking MC/DC Test Suite
AU - Zhenxiang, Chen
AU - Washizaki, Hironori
AU - Fukazawa, Yoshiaki
N1 - Publisher Copyright:
© 2020 IEEE.
PY - 2020/10
Y1 - 2020/10
N2 - Modified Condition and Decision Coverage (MC/DC) is a software testing criterion to check code coverage. It can be divided into a unique-cause MC/DC and masking MC/DC, according to the level of acceptance in concepts. Although masking MC/DC is used in many applications, in our study we found undetectable cases utilizing Masking MC/DC test suites that could be detected using stricter unique-cause MC/DC. To ensure the strictness of MC/DC criterion, herein we propose an automated tool that revises the masking MC/DC test suite into a unique-cause MC/DC.
AB - Modified Condition and Decision Coverage (MC/DC) is a software testing criterion to check code coverage. It can be divided into a unique-cause MC/DC and masking MC/DC, according to the level of acceptance in concepts. Although masking MC/DC is used in many applications, in our study we found undetectable cases utilizing Masking MC/DC test suites that could be detected using stricter unique-cause MC/DC. To ensure the strictness of MC/DC criterion, herein we propose an automated tool that revises the masking MC/DC test suite into a unique-cause MC/DC.
KW - Modified Condition and Decision Coverage
KW - Soft-ware testing
KW - masking MC/DC
UR - http://www.scopus.com/inward/record.url?scp=85099811800&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85099811800&partnerID=8YFLogxK
U2 - 10.1109/ISSREW51248.2020.00060
DO - 10.1109/ISSREW51248.2020.00060
M3 - Conference contribution
AN - SCOPUS:85099811800
T3 - Proceedings - 2020 IEEE 31st International Symposium on Software Reliability Engineering Workshops, ISSREW 2020
SP - 157
EP - 158
BT - Proceedings - 2020 IEEE 31st International Symposium on Software Reliability Engineering Workshops, ISSREW 2020
A2 - Vieira, Marco
A2 - Madeira, Henrique
A2 - Antunes, Nuno
A2 - Zheng, Zheng
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 31st IEEE International Symposium on Software Reliability Engineering Workshops, ISSREW 2020
Y2 - 12 October 2020 through 15 October 2020
ER -