抄録
High quality electron beam generation using photocathode rf-gun system and beam diagnostic techniques have been developed at Waseda University. This system can generate up to 4.6 MeV low emittance and short bunch electron beam. For bunch length monitor, rf-kicker technique is able to streak the electron bunch directly, using transverse magnetic field on the beam orbit. This technique is able to observe the longitudinal profile of the bunch and to achieve higher resolution than streak camera method.
| 本文言語 | English |
|---|---|
| ページ（範囲） | 229-230 |
| ページ数 | 2 |
| ジャーナル | Journal of Physics: Conference Series |
| 巻 | 31 |
| 号 | 1 |
| DOI | |
| 出版ステータス | Published - 2006 3月 22 |
ASJC Scopus subject areas
- 物理学および天文学（全般）