TY - GEN
T1 - Changes in Chemical Structure and Mechanical Properties Induced in Cross-linked Polyethylene by Thermal and Radiation Aging
AU - Miyazaki, Yu
AU - Hirai, Naoshi
AU - Ohki, Yoshimichi
N1 - Publisher Copyright:
© 2020 IEEE.
PY - 2020/7/5
Y1 - 2020/7/5
N2 - The degradation behavior of cross-linked polyethylene (XLPE) exposed to heat and radiation was investigated, focusing on its changes in chemical structure and mechanical properties. Infrared absorption spectroscopy (FT-IR), differential scanning calorimetry (DSC), and tensile tests were conducted. At the aging condition becomes more severe, the absorption due to carbonyl groups increases. In accord with this, the elongation at break decreases exponentially, while the enthalpy of fusion due to the melting of crystals decreases. When XLPE is exposed to heat and radiation, it is oxidized, which lowers the crystallinity and makes the crystals smaller. As a result, the mechanical properties of XLPE become degraded.
AB - The degradation behavior of cross-linked polyethylene (XLPE) exposed to heat and radiation was investigated, focusing on its changes in chemical structure and mechanical properties. Infrared absorption spectroscopy (FT-IR), differential scanning calorimetry (DSC), and tensile tests were conducted. At the aging condition becomes more severe, the absorption due to carbonyl groups increases. In accord with this, the elongation at break decreases exponentially, while the enthalpy of fusion due to the melting of crystals decreases. When XLPE is exposed to heat and radiation, it is oxidized, which lowers the crystallinity and makes the crystals smaller. As a result, the mechanical properties of XLPE become degraded.
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U2 - 10.1109/ICD46958.2020.9341944
DO - 10.1109/ICD46958.2020.9341944
M3 - Conference contribution
AN - SCOPUS:85101238146
T3 - Proceedings of the 2020 IEEE 3rd International Conference on Dielectrics, ICD 2020
SP - 45
EP - 48
BT - Proceedings of the 2020 IEEE 3rd International Conference on Dielectrics, ICD 2020
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 3rd IEEE International Conference on Dielectrics, ICD 2020
Y2 - 5 July 2020 through 9 July 2020
ER -