Characterization of y-ba-cu-o thin films on metallic substrates using co-evaporation technique

Kouki Satoh; Masashi Yoshihara; Minoru Nakajima; Tsukushi Hara; Hideo Ishii; Takahiko Yamamoto

doi:10.1143/JJAP.30.L1363

Characterization of y-ba-cu-o thin films on metallic substrates using co-evaporation technique

Kouki Satoh, Masashi Yoshihara, Minoru Nakajima, Tsukushi Hara, Hideo Ishii, Takahiko Yamamoto

研究成果: Article › 査読

1 被引用数 (Scopus)

抄録

A tape wire having the structure of YBCO/YSZ/Hastelloy, of which a YBCO layer was fabricated by a co-evaporation technique, was prepared. The critical current density J_c of 2.3 x 10⁴ A/cm² at 77 K and 0 T was obtained by using an rf coil and a dc bias at substrate heater during the YBCO layer growth, which enabled denser surface morphology in the YBCO layer. It was considered that the surface smoothness of a YSZ buffer layer had a large influence on the degree of c- axis orientation of the YBCO layer from the view of microstructural observation by transmission electron microscopy (TEM).

本文言語	English
ページ（範囲）	L1363-L1366
ジャーナル	Japanese journal of applied physics
巻	30
号	8
DOI	https://doi.org/10.1143/JJAP.30.L1363
出版ステータス	Published - 1991 8月
外部発表	はい

ASJC Scopus subject areas

工学（全般）
物理学および天文学（全般）

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10.1143/JJAP.30.L1363

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@article{701d1bea6b3d4d9babfaff435bf767ab,

title = "Characterization of y-ba-cu-o thin films on metallic substrates using co-evaporation technique",

abstract = "A tape wire having the structure of YBCO/YSZ/Hastelloy, of which a YBCO layer was fabricated by a co-evaporation technique, was prepared. The critical current density Jc of 2.3 x 104 A/cm2 at 77 K and 0 T was obtained by using an rf coil and a dc bias at substrate heater during the YBCO layer growth, which enabled denser surface morphology in the YBCO layer. It was considered that the surface smoothness of a YSZ buffer layer had a large influence on the degree of c- axis orientation of the YBCO layer from the view of microstructural observation by transmission electron microscopy (TEM).",

keywords = "BaCuO, Buffer layer, Co-evaporation, Metallic substrate, TEM observation, Thin film",

author = "Kouki Satoh and Masashi Yoshihara and Minoru Nakajima and Tsukushi Hara and Hideo Ishii and Takahiko Yamamoto",

year = "1991",

month = aug,

doi = "10.1143/JJAP.30.L1363",

language = "English",

volume = "30",

pages = "L1363--L1366",

journal = "Japanese journal of applied physics",

issn = "0021-4922",

publisher = "Japan Society of Applied Physics",

number = "8",

}

TY - JOUR

T1 - Characterization of y-ba-cu-o thin films on metallic substrates using co-evaporation technique

AU - Satoh, Kouki

AU - Yoshihara, Masashi

AU - Nakajima, Minoru

AU - Hara, Tsukushi

AU - Ishii, Hideo

AU - Yamamoto, Takahiko

PY - 1991/8

Y1 - 1991/8

N2 - A tape wire having the structure of YBCO/YSZ/Hastelloy, of which a YBCO layer was fabricated by a co-evaporation technique, was prepared. The critical current density Jc of 2.3 x 104 A/cm2 at 77 K and 0 T was obtained by using an rf coil and a dc bias at substrate heater during the YBCO layer growth, which enabled denser surface morphology in the YBCO layer. It was considered that the surface smoothness of a YSZ buffer layer had a large influence on the degree of c- axis orientation of the YBCO layer from the view of microstructural observation by transmission electron microscopy (TEM).

AB - A tape wire having the structure of YBCO/YSZ/Hastelloy, of which a YBCO layer was fabricated by a co-evaporation technique, was prepared. The critical current density Jc of 2.3 x 104 A/cm2 at 77 K and 0 T was obtained by using an rf coil and a dc bias at substrate heater during the YBCO layer growth, which enabled denser surface morphology in the YBCO layer. It was considered that the surface smoothness of a YSZ buffer layer had a large influence on the degree of c- axis orientation of the YBCO layer from the view of microstructural observation by transmission electron microscopy (TEM).

KW - BaCuO

KW - Buffer layer

KW - Co-evaporation

KW - Metallic substrate

KW - TEM observation

KW - Thin film

UR - http://www.scopus.com/inward/record.url?scp=0026205795&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0026205795&partnerID=8YFLogxK

U2 - 10.1143/JJAP.30.L1363

DO - 10.1143/JJAP.30.L1363

M3 - Article

AN - SCOPUS:0026205795

SN - 0021-4922

VL - 30

SP - L1363-L1366

JO - Japanese journal of applied physics

JF - Japanese journal of applied physics

IS - 8

ER -

Characterization of y-ba-cu-o thin films on metallic substrates using co-evaporation technique

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