抄録
A flip-chip bonding method has been developed for fabricating ultrafine-pitch pad-to-pad interconnects. The method utilizes the preferential growth of Ni-B bridge layers on resin walls in a microscale cavity structure fabricated in the underfill resin between copper pads facing each other under some conditions of electroless Ni-B plating. In this method, the interconnect can be fabricated without loading and/or heating. By controlling the growth of the bridge layer on the resin walls in the microscale cavity under optimized plating conditions, the feasibility of ultrafine-pitch flip-chip bonding with a 10-μm pad pitch is experimentally demonstrated at a temperature of 60°C.
本文言語 | English |
---|---|
ページ(範囲) | 732-737 |
ページ数 | 6 |
ジャーナル | ieice electronics express |
巻 | 5 |
号 | 18 |
DOI | |
出版ステータス | Published - 2008 9月 25 |
外部発表 | はい |
ASJC Scopus subject areas
- 電子材料、光学材料、および磁性材料
- 凝縮系物理学
- 電子工学および電気工学