TY - GEN
T1 - Comparative analysis of on-chip transmission line de-embedding techniques
AU - Amakawa, S.
AU - Katayama, K.
AU - Takano, K.
AU - Yoshida, T.
AU - Fujishima, M.
N1 - Publisher Copyright:
© 2015 IEEE.
PY - 2016/1/8
Y1 - 2016/1/8
N2 - Formal comparative analysis is presented of three known de-embedding and characteristic impedance estimation techniques for on-chip transmission lines, used after probe-tip calibration. Somewhat counterintuitively, experience accumulated in the field seems to suggest that the apparently most simplistic of the three gives much better results than the other two, more "accurate-looking" techniques. The reason, however, never seems to have been explained clearly. This paper attempts to explain why and suggests some new alternative techniques.
AB - Formal comparative analysis is presented of three known de-embedding and characteristic impedance estimation techniques for on-chip transmission lines, used after probe-tip calibration. Somewhat counterintuitively, experience accumulated in the field seems to suggest that the apparently most simplistic of the three gives much better results than the other two, more "accurate-looking" techniques. The reason, however, never seems to have been explained clearly. This paper attempts to explain why and suggests some new alternative techniques.
UR - http://www.scopus.com/inward/record.url?scp=84963617420&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84963617420&partnerID=8YFLogxK
U2 - 10.1109/RFIT.2015.7377897
DO - 10.1109/RFIT.2015.7377897
M3 - Conference contribution
AN - SCOPUS:84963617420
T3 - 2015 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2015 - Proceedings
SP - 91
EP - 93
BT - 2015 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2015 - Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2015
Y2 - 26 August 2015 through 28 August 2015
ER -