Comparison of location abilities of degradation in a polymer-insulated cable between frequency domain reflectometry and line resonance analysis

Yoshimichi Ohki; Naoshi Hirai

doi:10.1109/ICHVE.2016.7800602

Comparison of location abilities of degradation in a polymer-insulated cable between frequency domain reflectometry and line resonance analysis

Yoshimichi Ohki, Naoshi Hirai

各務記念材料技術研究所

研究成果: Conference contribution

8 被引用数 (Scopus)

抄録

The ability of locating a degraded portion in a double-core cable insulated with silicone rubber (SiR) or in a coaxial cable insulated with low-density polyethylene (LDPE) was compared between a system based on frequency domain reflectometry (FDR) being developed by the authors and a commercially available system called line resonance analysis (LIRA). Both the FDR and the LIRA methods cannot detect the degradation of SiR before its further use becomes uncommend-able in a nuclear power plant. However, for location trials of the degraded portion in the LDPE coaxial cable, the FDR method showed a higher sensitivity and a better resolution than LIRA.

本文言語	English
ホスト出版物のタイトル	ICHVE 2016 - 2016 IEEE International Conference on High Voltage Engineering and Application
出版社	Institute of Electrical and Electronics Engineers Inc.
ISBN（電子版）	9781509004966
DOI	https://doi.org/10.1109/ICHVE.2016.7800602
出版ステータス	Published - 2016 12月 27
イベント	5th IEEE International Conference on High Voltage Engineering and Application, ICHVE 2016 - Chengdu, China 継続期間: 2016 9月 19 → 2016 9月 22

出版物シリーズ

名前	ICHVE 2016 - 2016 IEEE International Conference on High Voltage Engineering and Application

Other

Other	5th IEEE International Conference on High Voltage Engineering and Application, ICHVE 2016
国/地域	China
City	Chengdu
Period	16/9/19 → 16/9/22

ASJC Scopus subject areas

エネルギー工学および電力技術
電子工学および電気工学

文献へのアクセス

10.1109/ICHVE.2016.7800602

他のファイルとリンク

フィンガープリント

「Comparison of location abilities of degradation in a polymer-insulated cable between frequency domain reflectometry and line resonance analysis」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

引用スタイル

Ohki, Y., & Hirai, N. (2016). Comparison of location abilities of degradation in a polymer-insulated cable between frequency domain reflectometry and line resonance analysis. In ICHVE 2016 - 2016 IEEE International Conference on High Voltage Engineering and Application 記事 7800602 (ICHVE 2016 - 2016 IEEE International Conference on High Voltage Engineering and Application). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICHVE.2016.7800602

Comparison of location abilities of degradation in a polymer-insulated cable between frequency domain reflectometry and line resonance analysis. / Ohki, Yoshimichi; Hirai, Naoshi.
ICHVE 2016 - 2016 IEEE International Conference on High Voltage Engineering and Application. Institute of Electrical and Electronics Engineers Inc., 2016. 7800602 (ICHVE 2016 - 2016 IEEE International Conference on High Voltage Engineering and Application).

研究成果: Conference contribution

Ohki, Y & Hirai, N 2016, Comparison of location abilities of degradation in a polymer-insulated cable between frequency domain reflectometry and line resonance analysis. in ICHVE 2016 - 2016 IEEE International Conference on High Voltage Engineering and Application., 7800602, ICHVE 2016 - 2016 IEEE International Conference on High Voltage Engineering and Application, Institute of Electrical and Electronics Engineers Inc., 5th IEEE International Conference on High Voltage Engineering and Application, ICHVE 2016, Chengdu, China, 16/9/19. https://doi.org/10.1109/ICHVE.2016.7800602

Ohki Y, Hirai N. Comparison of location abilities of degradation in a polymer-insulated cable between frequency domain reflectometry and line resonance analysis. In ICHVE 2016 - 2016 IEEE International Conference on High Voltage Engineering and Application. Institute of Electrical and Electronics Engineers Inc. 2016. 7800602. (ICHVE 2016 - 2016 IEEE International Conference on High Voltage Engineering and Application). doi: 10.1109/ICHVE.2016.7800602

Ohki, Yoshimichi ; Hirai, Naoshi. / Comparison of location abilities of degradation in a polymer-insulated cable between frequency domain reflectometry and line resonance analysis. ICHVE 2016 - 2016 IEEE International Conference on High Voltage Engineering and Application. Institute of Electrical and Electronics Engineers Inc., 2016. (ICHVE 2016 - 2016 IEEE International Conference on High Voltage Engineering and Application).

@inproceedings{d07256ff3813413dacb34c094f4f8cc7,

title = "Comparison of location abilities of degradation in a polymer-insulated cable between frequency domain reflectometry and line resonance analysis",

abstract = "The ability of locating a degraded portion in a double-core cable insulated with silicone rubber (SiR) or in a coaxial cable insulated with low-density polyethylene (LDPE) was compared between a system based on frequency domain reflectometry (FDR) being developed by the authors and a commercially available system called line resonance analysis (LIRA). Both the FDR and the LIRA methods cannot detect the degradation of SiR before its further use becomes uncommend-able in a nuclear power plant. However, for location trials of the degraded portion in the LDPE coaxial cable, the FDR method showed a higher sensitivity and a better resolution than LIRA.",

keywords = "aging, cable, frequency domain reflectometry, low-density polyethylene, silicone rubber",

author = "Yoshimichi Ohki and Naoshi Hirai",

note = "Publisher Copyright: {\textcopyright} 2016 IEEE.; 5th IEEE International Conference on High Voltage Engineering and Application, ICHVE 2016 ; Conference date: 19-09-2016 Through 22-09-2016",

year = "2016",

month = dec,

day = "27",

doi = "10.1109/ICHVE.2016.7800602",

language = "English",

series = "ICHVE 2016 - 2016 IEEE International Conference on High Voltage Engineering and Application",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

booktitle = "ICHVE 2016 - 2016 IEEE International Conference on High Voltage Engineering and Application",

}

TY - GEN

T1 - Comparison of location abilities of degradation in a polymer-insulated cable between frequency domain reflectometry and line resonance analysis

AU - Ohki, Yoshimichi

AU - Hirai, Naoshi

PY - 2016/12/27

Y1 - 2016/12/27

N2 - The ability of locating a degraded portion in a double-core cable insulated with silicone rubber (SiR) or in a coaxial cable insulated with low-density polyethylene (LDPE) was compared between a system based on frequency domain reflectometry (FDR) being developed by the authors and a commercially available system called line resonance analysis (LIRA). Both the FDR and the LIRA methods cannot detect the degradation of SiR before its further use becomes uncommend-able in a nuclear power plant. However, for location trials of the degraded portion in the LDPE coaxial cable, the FDR method showed a higher sensitivity and a better resolution than LIRA.

AB - The ability of locating a degraded portion in a double-core cable insulated with silicone rubber (SiR) or in a coaxial cable insulated with low-density polyethylene (LDPE) was compared between a system based on frequency domain reflectometry (FDR) being developed by the authors and a commercially available system called line resonance analysis (LIRA). Both the FDR and the LIRA methods cannot detect the degradation of SiR before its further use becomes uncommend-able in a nuclear power plant. However, for location trials of the degraded portion in the LDPE coaxial cable, the FDR method showed a higher sensitivity and a better resolution than LIRA.

KW - aging

KW - cable

KW - frequency domain reflectometry

KW - low-density polyethylene

KW - silicone rubber

UR - http://www.scopus.com/inward/record.url?scp=85010445018&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85010445018&partnerID=8YFLogxK

U2 - 10.1109/ICHVE.2016.7800602

DO - 10.1109/ICHVE.2016.7800602

M3 - Conference contribution

AN - SCOPUS:85010445018

T3 - ICHVE 2016 - 2016 IEEE International Conference on High Voltage Engineering and Application

BT - ICHVE 2016 - 2016 IEEE International Conference on High Voltage Engineering and Application

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 5th IEEE International Conference on High Voltage Engineering and Application, ICHVE 2016

Y2 - 19 September 2016 through 22 September 2016

ER -