TY - JOUR
T1 - Control of interfacial structure of potassium niobate-barium titanate ceramics and their dielectric properties
AU - Yamashita, K.
AU - Shimizu, S.
AU - Fujii, I.
AU - Nakashima, K.
AU - Kumada, N.
AU - Tsukada, T.
AU - Suzuki, T. S.
AU - Uchikoshi, T.
AU - Sakka, Y.
AU - Wada, S.
PY - 2011
Y1 - 2011
N2 - ANbO3-BaTiO3 (AK, Na, or K0.5Na0.5) system ceramics were prepared using a conventional sintering method, and their dielectric properties were investigated. It was found that the dielectric constant of KNbO3-BaTiO3 system ceramics did not strongly depend on temperature between 20 and 400 °C, making them useful for capacitor application. However, the dielectric constant of KNbO3-BaTiO3 system ceramics was low. The high dielectric constant is attributable to a large area of interfaces between KN and BT grains. Ceramics sintered by spark plasma sintering (SPS) are expected to suppress a grain growth, increasing area of the interfacial layer. In this study, SPS method was employed to achieve a large area of the interfaces and to see how the dielectric properties change with the interfacial structure. The structure was controlled by changing sintering temperatures and time of the spark plasma sintering. As a result, X-ray diffraction patterns showed that perovskite single phase and their relative densities were greater than 97%. By contrast, the dielectric constant was decreased.
AB - ANbO3-BaTiO3 (AK, Na, or K0.5Na0.5) system ceramics were prepared using a conventional sintering method, and their dielectric properties were investigated. It was found that the dielectric constant of KNbO3-BaTiO3 system ceramics did not strongly depend on temperature between 20 and 400 °C, making them useful for capacitor application. However, the dielectric constant of KNbO3-BaTiO3 system ceramics was low. The high dielectric constant is attributable to a large area of interfaces between KN and BT grains. Ceramics sintered by spark plasma sintering (SPS) are expected to suppress a grain growth, increasing area of the interfacial layer. In this study, SPS method was employed to achieve a large area of the interfaces and to see how the dielectric properties change with the interfacial structure. The structure was controlled by changing sintering temperatures and time of the spark plasma sintering. As a result, X-ray diffraction patterns showed that perovskite single phase and their relative densities were greater than 97%. By contrast, the dielectric constant was decreased.
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U2 - 10.1088/1757-899X/18/9/092065
DO - 10.1088/1757-899X/18/9/092065
M3 - Conference article
AN - SCOPUS:84898771128
SN - 1757-8981
VL - 18
JO - IOP Conference Series: Materials Science and Engineering
JF - IOP Conference Series: Materials Science and Engineering
IS - SYMPOSIUM 6
M1 - 092065
T2 - 3rd International Congress on Ceramics, ICC 2011
Y2 - 14 November 2010 through 18 November 2010
ER -