TY - GEN
T1 - Corporate-feed slotted wavguide array antenna at 350 GHz band by silicon process
AU - Tekkouk, Karim
AU - Hirokawa, Jiro
AU - Oogimoto, Kazuki
AU - Nagatsuma, Tadao
AU - Seto, Hiroyuki
AU - Inoue, Yoshiyuki
AU - Saito, Mikiko
PY - 2016/10/25
Y1 - 2016/10/25
N2 - A corporate feed slotted waveguide array antenna with broadband characteristics in term of gain in the 350 GHz band is achieved by measurement for the first time. The etching accuracy for thin laminated plates of the diffusion bonding process with conventional chemical etching is limited to ±20μm. This limits the use of this process for antenna fabrication in the submillimeter wave band where the fabrication tolerances are very severe. To improve the etching accuracy of the thin laminated plates, a new fabrication process has been developed. Each silicon wafer is etched by DRIE (deep reactive ion etcher) and is plated by gold on the surface. This new fabrication process provides better fabrication tolerances about ±5μ™ using wafer bond aligner. The thin laminated wafers are then bonded with the diffusion bonding process under high temperature and high pressure. To validate the proposed antenna concepts, four antenna prototypes have been designed and fabricated in the 350 GHz band. The 3dB-down gain bandwidth is about 35GHz by this silicon process while it was about 15GHz by the conventional process using metal plates in measurement.
AB - A corporate feed slotted waveguide array antenna with broadband characteristics in term of gain in the 350 GHz band is achieved by measurement for the first time. The etching accuracy for thin laminated plates of the diffusion bonding process with conventional chemical etching is limited to ±20μm. This limits the use of this process for antenna fabrication in the submillimeter wave band where the fabrication tolerances are very severe. To improve the etching accuracy of the thin laminated plates, a new fabrication process has been developed. Each silicon wafer is etched by DRIE (deep reactive ion etcher) and is plated by gold on the surface. This new fabrication process provides better fabrication tolerances about ±5μ™ using wafer bond aligner. The thin laminated wafers are then bonded with the diffusion bonding process under high temperature and high pressure. To validate the proposed antenna concepts, four antenna prototypes have been designed and fabricated in the 350 GHz band. The 3dB-down gain bandwidth is about 35GHz by this silicon process while it was about 15GHz by the conventional process using metal plates in measurement.
KW - DRIE (deep reactive ion etcher)
KW - Diffusion bonding process
KW - Silicon process
KW - Submillimeter wave antennas
KW - corporate feed waveguide
KW - slotted waveguide array
UR - http://www.scopus.com/inward/record.url?scp=84997335631&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84997335631&partnerID=8YFLogxK
U2 - 10.1109/APS.2016.7696306
DO - 10.1109/APS.2016.7696306
M3 - Conference contribution
AN - SCOPUS:84997335631
T3 - 2016 IEEE Antennas and Propagation Society International Symposium, APSURSI 2016 - Proceedings
SP - 1197
EP - 1198
BT - 2016 IEEE Antennas and Propagation Society International Symposium, APSURSI 2016 - Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2016 IEEE Antennas and Propagation Society International Symposium, APSURSI 2016
Y2 - 26 June 2016 through 1 July 2016
ER -