CRYSTAL SPECTROSCOPY FOR K// alpha X-RAY FROM SILICON BOMBARDED WITH PROTONS AND ALPHA PARTICLES.

Shin ichi Akanuma; Nobuo Kishimoto; Takatoshi Irie; Naoto Kobayashi; Masakatsu Sakisaka

CRYSTAL SPECTROSCOPY FOR K// alpha X-RAY FROM SILICON BOMBARDED WITH PROTONS AND ALPHA PARTICLES.

Shin ichi Akanuma^*, Nobuo Kishimoto, Takatoshi Irie, Naoto Kobayashi, Masakatsu Sakisaka

^*この研究の対応する著者

研究成果: Article › 査読

抄録

An automated Bragg spectrometer in whcih an organic electron multiplier is employed as an X-ray detector has been designed, and the K// alpha diagram and satellite X-rays from silicon bombarded with hydrogen and helium ions at MeV energies have been analyzed. The procedures for deriving the ionization cross sections from the satellite intensities are described. The multiple KL**m ionization cross sections are compared with the theoretical binomial distribution, which is a statistical superposition of single ionizations.

本文言語	English
ページ（範囲）	208-219
ページ数	12
ジャーナル	Memoirs of the Faculty of Engineering, Kyoto University
巻	41
号	pt 3
出版ステータス	Published - 1979 7月
外部発表	はい

ASJC Scopus subject areas

工学（全般）

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abstract = "An automated Bragg spectrometer in whcih an organic electron multiplier is employed as an X-ray detector has been designed, and the K// alpha diagram and satellite X-rays from silicon bombarded with hydrogen and helium ions at MeV energies have been analyzed. The procedures for deriving the ionization cross sections from the satellite intensities are described. The multiple KL**m ionization cross sections are compared with the theoretical binomial distribution, which is a statistical superposition of single ionizations.",

author = "Akanuma, {Shin ichi} and Nobuo Kishimoto and Takatoshi Irie and Naoto Kobayashi and Masakatsu Sakisaka",

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AU - Akanuma, Shin ichi

AU - Kishimoto, Nobuo

AU - Irie, Takatoshi

AU - Kobayashi, Naoto

AU - Sakisaka, Masakatsu

PY - 1979/7

Y1 - 1979/7

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AB - An automated Bragg spectrometer in whcih an organic electron multiplier is employed as an X-ray detector has been designed, and the K// alpha diagram and satellite X-rays from silicon bombarded with hydrogen and helium ions at MeV energies have been analyzed. The procedures for deriving the ionization cross sections from the satellite intensities are described. The multiple KL**m ionization cross sections are compared with the theoretical binomial distribution, which is a statistical superposition of single ionizations.

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CRYSTAL SPECTROSCOPY FOR K// alpha X-RAY FROM SILICON BOMBARDED WITH PROTONS AND ALPHA PARTICLES.

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