TY - GEN
T1 - Deep neural networks with mixture of experts layers for complex event recognition from images
AU - Li, Mingyao
AU - Kamata, Sei Ichiro
N1 - Funding Information:
ACKNOWLEDGMENT This work was partially supported by JSPS KAKENHI Grant Number 15K00248.
Publisher Copyright:
© 2018 IEEE.
PY - 2018/7/2
Y1 - 2018/7/2
N2 - With the need for the real-world applications, event recognition from static images has become more and more popular in these years. Although there remain good achievements, recognizing events from images with a complex background like WIDER dataset is still very hard to get good results. In this paper, we show this gap is probably caused by the large discrepancy of data. Most of the existing methods choose to use various modifications on pre-trained CNN network model to solve the problem. Although we follow this thought, after a review of existing methods, we choose two other ways to solve this problem. Firstly, we reveal that a deep one-channel model with end-to-end structure is more suitable to this problem than other multi-channel or multi-task models, which leads we to propose a model under this rule by modifying on one single pre-trained ResNet channel. Secondly, we propose a Mixture of Experts (MoE) neural network layer to overcome the large discrepancy of data. To increase the performance and enhance the specialization of the MoE layer, we also involve a simple neural network transfer method, Elastic Weight Consolidation, to transfer knowledge from SocEID dataset. The result shows that we enhance the accuracy of the WIDER dataset from the state-of-the-art by 9.4% with lower computational time and memory consumption. And some experiments are also listed there to proof the validation of our method.
AB - With the need for the real-world applications, event recognition from static images has become more and more popular in these years. Although there remain good achievements, recognizing events from images with a complex background like WIDER dataset is still very hard to get good results. In this paper, we show this gap is probably caused by the large discrepancy of data. Most of the existing methods choose to use various modifications on pre-trained CNN network model to solve the problem. Although we follow this thought, after a review of existing methods, we choose two other ways to solve this problem. Firstly, we reveal that a deep one-channel model with end-to-end structure is more suitable to this problem than other multi-channel or multi-task models, which leads we to propose a model under this rule by modifying on one single pre-trained ResNet channel. Secondly, we propose a Mixture of Experts (MoE) neural network layer to overcome the large discrepancy of data. To increase the performance and enhance the specialization of the MoE layer, we also involve a simple neural network transfer method, Elastic Weight Consolidation, to transfer knowledge from SocEID dataset. The result shows that we enhance the accuracy of the WIDER dataset from the state-of-the-art by 9.4% with lower computational time and memory consumption. And some experiments are also listed there to proof the validation of our method.
KW - CNN
KW - Complex Event Recognition
KW - Deep Learning
KW - Elastic Weight Consolidation
KW - Event Recognition
KW - Mixture of Experts
UR - http://www.scopus.com/inward/record.url?scp=85063209687&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85063209687&partnerID=8YFLogxK
U2 - 10.1109/ICIEV.2018.8641027
DO - 10.1109/ICIEV.2018.8641027
M3 - Conference contribution
AN - SCOPUS:85063209687
T3 - 2018 Joint 7th International Conference on Informatics, Electronics and Vision and 2nd International Conference on Imaging, Vision and Pattern Recognition, ICIEV-IVPR 2018
SP - 410
EP - 415
BT - 2018 Joint 7th International Conference on Informatics, Electronics and Vision and 2nd International Conference on Imaging, Vision and Pattern Recognition, ICIEV-IVPR 2018
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - Joint 7th International Conference on Informatics, Electronics and Vision and 2nd International Conference on Imaging, Vision and Pattern Recognition, ICIEV-IVPR 2018
Y2 - 25 June 2018 through 28 June 2018
ER -