Design for secure test - A case study on pipelined advanced encryption standard

Youhua Shi*, Nozomu Togawa, Masao Yanagisawa, Tatsuo Ohtsuki


研究成果: Conference article査読

3 被引用数 (Scopus)


Cryptography plays an important role in the security of data transmission. To ensure the correctness of crypto hardware, we should conduct testing at fabrication and infield. However, the state-of-the-art scan-based test techniques, to achieve high test qualities, need to increase the testability of the circuit under test, which carries a potential of being misused to reveal the secret information of the crypto hardware. Thus, to develop efficient test strategies for crypto hardware to achieve high test quality without compromising security becomes an important task. In this paper we discuss the development of a Design-forSecure-Test (DFST) technique for pipelined AES to overcome the above contradiction between security and test quality in testing crypto hardware. Unlike previous works, the proposed method can keep all the secrets inside and provide high test quality and fault diagnosis ability as well. Furthermore, the proposed DFST technique can significantly reduce test application time, test data volume, and test generation effort as additional benefits.

ジャーナルProceedings - IEEE International Symposium on Circuits and Systems
出版ステータスPublished - 2007
イベント2007 IEEE International Symposium on Circuits and Systems, ISCAS 2007 - New Orleans, LA, United States
継続期間: 2007 5月 272007 5月 30

ASJC Scopus subject areas

  • 電子工学および電気工学


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