TY - GEN
T1 - Design verification for product line development
AU - Kishi, Tomoji
AU - Noda, Natsuko
AU - Katayama, Takuya
PY - 2005/12/1
Y1 - 2005/12/1
N2 - Our society is becoming increasingly dependent on embedded software, and its reliability becomes more and more important. Although we can utilize powerful scientific methods such as model checking techniques to develop reliable embedded software, it is expensive to apply these methods to consumer embedded software development. In this paper, we propose an application of model checking techniques for design verification in product line development (PLD). We introduce reusable verification models in which we define variation points, and we show how to define traceability among feature models, design models and verification models. The reuse of verification models in PLD not only enables the systematic design verification of each product but also reduces the cost of applying model checking techniques.
AB - Our society is becoming increasingly dependent on embedded software, and its reliability becomes more and more important. Although we can utilize powerful scientific methods such as model checking techniques to develop reliable embedded software, it is expensive to apply these methods to consumer embedded software development. In this paper, we propose an application of model checking techniques for design verification in product line development (PLD). We introduce reusable verification models in which we define variation points, and we show how to define traceability among feature models, design models and verification models. The reuse of verification models in PLD not only enables the systematic design verification of each product but also reduces the cost of applying model checking techniques.
UR - http://www.scopus.com/inward/record.url?scp=33646173411&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=33646173411&partnerID=8YFLogxK
U2 - 10.1007/11554844_18
DO - 10.1007/11554844_18
M3 - Conference contribution
AN - SCOPUS:33646173411
SN - 3540289364
SN - 9783540289364
T3 - Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
SP - 150
EP - 161
BT - Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
T2 - 9th International Conference on Software Product Lines, SPLC 2005
Y2 - 26 September 2005 through 29 September 2005
ER -