TY - GEN
T1 - Detecting facial expressions from face images using a genetic algorithm
AU - Ohya, Jun
AU - Kishino, Fumio
PY - 1996/1/1
Y1 - 1996/1/1
N2 - A new method to detect deformations of facial parts from a face image regardless of changes in the position and orientation of a face using the genetic algorithm is proposed. Facial expression parameters that are used to deform and position a 3D face model are assigned to the genes of an individual in a population. The face model is deformed and positioned according to the gene values of each individual and is observed by a virtual camera, and a face image is synthesized. The fitness which evaluates to what extent the real and synthesized face images are similar to each other is calculated. After this process is repeated for sufficient generations, the parameter estimation is obtained from the genes of the individual with the best fitness. Experimental results demonstrate the effectiveness of the method.
AB - A new method to detect deformations of facial parts from a face image regardless of changes in the position and orientation of a face using the genetic algorithm is proposed. Facial expression parameters that are used to deform and position a 3D face model are assigned to the genes of an individual in a population. The face model is deformed and positioned according to the gene values of each individual and is observed by a virtual camera, and a face image is synthesized. The fitness which evaluates to what extent the real and synthesized face images are similar to each other is calculated. After this process is repeated for sufficient generations, the parameter estimation is obtained from the genes of the individual with the best fitness. Experimental results demonstrate the effectiveness of the method.
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U2 - 10.1109/ICPR.1996.547026
DO - 10.1109/ICPR.1996.547026
M3 - Conference contribution
AN - SCOPUS:84898789371
SN - 081867282X
SN - 9780818672828
T3 - Proceedings - International Conference on Pattern Recognition
SP - 649
EP - 653
BT - Track C
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 13th International Conference on Pattern Recognition, ICPR 1996
Y2 - 25 August 1996 through 29 August 1996
ER -