We developed an aperture-type near-field reflection spectral imaging method to obtain optical properties of materials with a nanometer spatial resolution. We adopted a phase-stepping technique to extract genuine near-field signals of a sample from the observed intensity spectra dominated by the large background, in a multiplex manner. We performed near-field reflection spectral imaging of a single silver nanoplate to evaluate the developed system and also to examine near-field optical properties of the nanoplate. The near-field reflection spectrum of the nanoplate shows multiple resonant features that are not observable by conventional methods. The near-field reflection image taken at the resonance shows unique spatial features attributable to the plasmon mode resonantly excited. The developed system is applicable to transparent samples as well as opaque ones and enables spectral as well as spatial characteristics of the samples to be revealed.
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