Device Data Application Phase1 on Trusted Data Platform GAIA-X for Decarbonization in Industry

Akio Ito, Akira Sakaino, Shinichiro Chino, Takashi Horikoshi, Mitsushiro Fujishima, Shuichi Ogawa, Tetsuo Takeuchi, Yoshiharu Amano

研究成果: Conference contribution

2 被引用数 (Scopus)

抄録

We started investigation of a proving test equipment development which corresponds to field device tool (FDT®, IEC62453) ver. 3.0 (FDT 3.0) to study theoretically the issues of field device level requirements for industrial smart system design. We select carbon emission data international trade system using European secure data-sharing platform GAIA-X as the target future production system which utilizes FDT3.0. We created a proving test equipment architecture for all automation industry domain including process automation (PA) and factory automation (FA). Manufacturing Execution Systems (MES) study part of the proving test equipment for FA side is constructed and demonstrated at IIFES2022 in collaboration with IAF. We will continue our research to show the use cases which utilizes device data effectively.

本文言語English
ホスト出版物のタイトル2022 61st Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2022
出版社Institute of Electrical and Electronics Engineers Inc.
ページ17-24
ページ数8
ISBN(電子版)9784907764784
DOI
出版ステータスPublished - 2022
イベント61st Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2022 - Kumamoto, Japan
継続期間: 2022 9月 62022 9月 9

出版物シリーズ

名前2022 61st Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2022

Conference

Conference61st Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2022
国/地域Japan
CityKumamoto
Period22/9/622/9/9

ASJC Scopus subject areas

  • 人工知能
  • コンピュータ サイエンスの応用
  • 制御およびシステム工学
  • 制御と最適化
  • 器械工学

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