Dielectric properties of CaCu3Ti4O 12/CaTiO3 multilayer thin films synthesized by PLD method

Masakazu Mitsugi; Mamoru Fukunaga; Shutaro Asanuma; Yoshiaki Uesu; Wataru Kobayashi; Ichiro Terasaki

doi:10.1080/00150190701544311

Dielectric properties of CaCu3Ti4O 12/CaTiO3 multilayer thin films synthesized by PLD method

Masakazu Mitsugi, Mamoru Fukunaga, Shutaro Asanuma, Yoshiaki Uesu^*, Wataru Kobayashi, Ichiro Terasaki

^*この研究の対応する著者

研究成果: Article › 査読

1 被引用数 (Scopus)

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In order to elucidate the origin of the characteristic dielectric response of CaCu₃Ti₄O₁₂ (CCTO), we synthesize c-axis oriented multilayer thin films composed of alternative layers of CCTO and an insulator CaTiO₃ (CTO) using the Pulsed Laser Deposition (PLD) method and measure the capacitance of CTO/CCTO/CTO multilayer thin films with different thicknesses of CTO and CCTO layers. After removing the extrinsic electrode/CCTO boundary effect and the CCTO/CTO interface effect, the inherent dielectric constant of CCTO is determined.

本文言語	English
ページ（範囲）	191-195
ページ数	5
ジャーナル	Ferroelectrics
巻	357
号	1 PART 3
DOI	https://doi.org/10.1080/00150190701544311
出版ステータス	Published - 2007

ASJC Scopus subject areas

電子材料、光学材料、および磁性材料
凝縮系物理学

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10.1080/00150190701544311

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title = "Dielectric properties of CaCu3Ti4O 12/CaTiO3 multilayer thin films synthesized by PLD method",

abstract = "In order to elucidate the origin of the characteristic dielectric response of CaCu3Ti4O12 (CCTO), we synthesize c-axis oriented multilayer thin films composed of alternative layers of CCTO and an insulator CaTiO3 (CTO) using the Pulsed Laser Deposition (PLD) method and measure the capacitance of CTO/CCTO/CTO multilayer thin films with different thicknesses of CTO and CCTO layers. After removing the extrinsic electrode/CCTO boundary effect and the CCTO/CTO interface effect, the inherent dielectric constant of CCTO is determined.",

keywords = "CaCuTiO, Dielectric constant, Pulsed laser deposition, Thin films",

author = "Masakazu Mitsugi and Mamoru Fukunaga and Shutaro Asanuma and Yoshiaki Uesu and Wataru Kobayashi and Ichiro Terasaki",

year = "2007",

doi = "10.1080/00150190701544311",

language = "English",

volume = "357",

pages = "191--195",

journal = "Ferroelectrics",

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T1 - Dielectric properties of CaCu3Ti4O 12/CaTiO3 multilayer thin films synthesized by PLD method

AU - Mitsugi, Masakazu

AU - Fukunaga, Mamoru

AU - Asanuma, Shutaro

AU - Uesu, Yoshiaki

AU - Kobayashi, Wataru

AU - Terasaki, Ichiro

PY - 2007

Y1 - 2007

N2 - In order to elucidate the origin of the characteristic dielectric response of CaCu3Ti4O12 (CCTO), we synthesize c-axis oriented multilayer thin films composed of alternative layers of CCTO and an insulator CaTiO3 (CTO) using the Pulsed Laser Deposition (PLD) method and measure the capacitance of CTO/CCTO/CTO multilayer thin films with different thicknesses of CTO and CCTO layers. After removing the extrinsic electrode/CCTO boundary effect and the CCTO/CTO interface effect, the inherent dielectric constant of CCTO is determined.

AB - In order to elucidate the origin of the characteristic dielectric response of CaCu3Ti4O12 (CCTO), we synthesize c-axis oriented multilayer thin films composed of alternative layers of CCTO and an insulator CaTiO3 (CTO) using the Pulsed Laser Deposition (PLD) method and measure the capacitance of CTO/CCTO/CTO multilayer thin films with different thicknesses of CTO and CCTO layers. After removing the extrinsic electrode/CCTO boundary effect and the CCTO/CTO interface effect, the inherent dielectric constant of CCTO is determined.

KW - CaCuTiO

KW - Dielectric constant

KW - Pulsed laser deposition

KW - Thin films

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U2 - 10.1080/00150190701544311

DO - 10.1080/00150190701544311

M3 - Article

AN - SCOPUS:75449107553

SN - 0015-0193

VL - 357

SP - 191

EP - 195

JO - Ferroelectrics

JF - Ferroelectrics

IS - 1 PART 3

ER -

Dielectric properties of CaCu3Ti4O 12/CaTiO3 multilayer thin films synthesized by PLD method

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