抄録
We have directly measured carrier tunneling times between vertically aligned double quantum dots (QD’s) using time-resolved photoluminescence measurement. The vertically aligned double QD structure consists of (Formula presented) QD’s, a GaAs barrier layer, and InAs QD’s. The tunneling times were measured for the three different barrier thicknesses. The dependence of the tunneling time on the barrier thickness is in agreement with the Wentzel-Kramers-Brillouin approximation. The nonresonant tunneling rate between QD’s is found to be suppressed to one-tenth of the tunneling rate between quantum wells.
本文言語 | English |
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ページ(範囲) | 1568-1571 |
ページ数 | 4 |
ジャーナル | Physical Review B - Condensed Matter and Materials Physics |
巻 | 62 |
号 | 3 |
DOI | |
出版ステータス | Published - 2000 |
ASJC Scopus subject areas
- 電子材料、光学材料、および磁性材料
- 凝縮系物理学